HiTEN 2019

Date, Type of contribution, Location:

08 July 2019–10 July 2019,Talk,St. Anne’s College in the University of Oxford. Oxford, United Kingdom

Event:

International Conference and Exhibition on High Temperature Electronics Network

Modular Desktop Platform for High-Temperature Characterization and Test up to 300°C. Tom Reinhold, Björn Bieske, Georg Gläser, Michael Meister

A modular application specific active test environment for high temperature wafertest up to 300 °C. Michael Meister, Marco Reinhard

Contact

Dipl.-Hdl. Dipl.-Des. Beate Hövelmans

Head of Corporate Communications

beate.hoevelmans(at)imms.de+49 (0) 3677 874 93 13

Beate Hövelmans is responsible for the text and image editorial work on this website, for the social media presence of IMMS on LinkedIn and YouTube, the annual reports, for press and media relations with regional and specialist media and other communication formats. She provides texts, photographs and video material for your reporting on IMMS, arranges contacts for interviews and is the contact person for events.

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