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Reference

1081. Mehr Transparenz in der Produktion und in Prozessen durch nachrüstbare Sensorik

Jörg Weber, Jenaer Technologietag, Digitale Arbeitswelten, Workshop zu Technologie, 31. Januar 2018, Ernst-Abbe-Hochschule, Jena

Service for R&D

1082. MEMS – simulation, design and test

FE simulation of a MEMS structure as a basis for design optimisations. Photograph: IMMS.

Service for R&D: MEMS – simulation, design and test. As a design house for the open technology platform XMB-10 from X-FAB, we develop acceleration sensors according to your specification in a semi-automated design process.

Press release

1083. MEMS design methodology honoured with the EDA Achievement Award 2015

EDA Achievement Award 2015 for the work of IMMS und Ilmenau TU on schematic-driven MEMS design. Photograph: IMMS.

IMMS and Ilmenau TU’s methodology opens up cost-efficient MEMS developments and novel applications.

Reference

1084. MEMS-T-Lab

In this test lab IMMS takes highly complex measurements of complete MEMS wafers at a new level of automation. Photograph: IMMS.

In the MEMS-T-Lab, IMMS takes highly complex semi-automated measurements for complete MEMS wafers

Reference

1085. MEMS-Vibro3D

New 3D vibrometer system for MEMS. Photograph: IMMS.

Research infrastructure for the next MEMS generation: 3D vibrometer system and new broadband amplifier

Reference

1086. MEMS2015

MEMS design for an accelerometer which was created with the new design tool developed by IMMS. Photograph: IMMS.

The IMMS tool automatically generates mechanical designs. MEMS can be simulated and verified as an entire system.

Reference

1087. MEMS2015 - Schaltplan-basierter Entwurf von MEMS für Anwendungen in Optik und Robotik

Volker Boos, Ralf Popp Mirco Meiners D. Meisel A. Müller in Newsletter edacentrum, 01/2013

Reference

1088. Messtechnisch gestützte Beratung und Analyse des Kosteneinsparpotenzials

H. Töpfer, Gera: Enterprise Europe Network Thüringen- Unternehmerworkshop. 13.04.2011

Reference

1089. Messumgebung für Lebensdauertests basierend auf dem Konzept der universellen Test-Chips (UTC)

Björn Bieske, Ingo Gryl Pierre Wenke Martin Jäger Jörg Steinecke Xiao Liu 35. ITG/GI/GMM-Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ 2023), 26. - 28. Februar 2023, Erfurt, Germany

Reference

1090. Messumgebung zur dynamischen Charakterisierung des Leistungsverbrauchs von Ultra-Low-Power Schaltungen

Marco Reinhard, Alexander Rolapp Benjamin Saft Michael Meister 31. GI/GMM/ITG-Workshop, Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ 2019), 24.-26. Februar 2019, Prien am Chiemsee