Elena Chervakova,
Sven Engelhardt
Marco Goetze
Michael Rink
Axl Schreiber
DASIP 2015, Conference on Design & Architectures for Signal & Image Processing, 23.09.2015 - 25.09.2015, Cracow, Poland, (Best-Demo-Night-Award)
Dienstleistungen Industrielle Elektronik und Messtechnik
Service Range Industrial Electronic and Measurement Technology RF on-wafer measurement Based on many years of experience in circuit design and measurement technology, IMMS designs and implements innovative methods for micro and nano technology. Our services include • Measurements at transistor level • Measurement of modules • Characterization of complex applications • Circuit design / PCB layout. en pm S vel o de SYS TEM in RF ne ss POWER ELECTRONICS on Reliability in application cti High-end semiconductor test…
Christoph Schäffel,
Michael Katzschmann
Hans-Ulrich Mohr
Rainer Glöss
Christian Rudolf
Carolin Walenda
JSME Mechanical Engineering Journal, DOI: http://dx.doi.org/10.1299/mej.15-00111, 16.10.2015
A. Tag,
V. Chauhan
R. Weigel
A. Hagelauer
B. Bader
C. Huck
M. Pitschi
D. Karolewski
IEEE International Ultrasonics Symposium (IUS), 21 – 24 Oct. 2015,
DOI: http://dx.doi.org/10.1109/ULTSYM.2015.0115, ISBN: 978-1-4799-8182-3, Taipei, Taiwan
2012 Jahresbericht | Nominierung für den Innovationspreis Thüringen
TESTIM ONI ALS IMMS nominated for Thüringen’s 2012 Innovation Prize for magnetic levitation direct drive Having been nominated for the Thüringen Innovation Prize in 2012, IMMS was among the top three competitors in the “Industry and Materials” category. The direct drive is a positioning system completely controlled by magnetism and permitting a load to be swayed accurately through six coordinates. The IMMS made up of optical and capacitive detectors. Conventional sensors have to date worked on the laser interferometry…
2010 Jahresbericht | Fachartikel SMARTIEHS (en/de)
15 Optimized Test of MEMS Hence, as an example, the whole conception of the nic control system on a substratum respectively on The fabrication processes of MEMS require a se- the components of the project partners. Another a chip. Mostly their size is only a few micrometers quence of test steps for the monitoring of quality subtask is the development of the regulation of the (example see figure 1). These tiny systems have un- and for the safeguarding of performance parame- scanning unit. But IMMS brings in already existing …
