Current Publication
Influence of temperature distribution on behavior, modeling, and reliability of BAW resonators
A. Tag1.
R. Weigel1.
A. Hagelauer1.
B. Bader2.
C. Huck2.
M. Pitschi2.
K. Wagner2.
D. Karolewski3.
C. Schäffel3.
Reliability Physics Symposium, 2014 IEEE International , Pages 5C.5.1 - 5C.5.7, DOI: dx.doi.org/10.1109/IRPS.2014.6860669
1Institute for Electronics Engineering University of Erlangen-Nuremberg.
2TDK Corporation.
3IMMS Institut für Mikroelektronik- und Mechatronik-Systeme gemeinnützige GmbH.