Current Publication
Embedded tutorial: Analog-/mixed-signal verification methods for AMS coverage analysis
Erich Barke1.
Georg Gläser2.
Hyun-Sek Lukas Lee1. Markus Olbrich1.
Andreas Fürtig3. Lars Hedrich3.
Carna Radojicic4. Christoph Grimm4.
Fabian Speicher8. Stefan Heinen8.
Gregor Nitsche6.
Eckhard Hennig5.
Wolfgang Nebel7.
2016 Design, Automation & Test in Europe (DATE), 14-18 March 2016, pp. 1102 - 1111, ieeexplore.ieee.org/stamp/stamp.jsp
1Institute of Microelectronic Systems, Leibniz Universität Hannover, Germany.
2IMMS Institut für Mikroelektronik- und Mechatronik-Systeme gemeinnützige GmbH, D-98693 Ilmenau, Germany.
3Johann Wolfgang Goethe-Universität, Germany.
4University of Kaiserslautern, Germany.
5Reutlingen University, Germany.
6OFFIS - Institut für Informatik Oldenburg, Germany.
7University of Oldenburg and OFFIS, Germany.
8RWTH Aachen, Germany.