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Silicon Science Award for thesis "Development and characterisation of a circuit topology for generating short LED light pulses"

Silicon Science Award, in the 2025 competition for outstanding bachelor's, master's or diploma theses and dissertations, CiS e.V.
Date:
Award:
Silicon Science Award for thesis "Development and characterisation of a circuit topology for generating short LED light pulses"
Authors:
Vincent Haude.
Event:

WaferBond 2025, Conference on Wafer Bonding for Microsystems, 3D- and Wafer Level Integration, Chemnitz, 3.12.2025

 
1IMMS Institut für Mikroelektronik- und Mechatronik-Systeme gemeinnützige GmbH (IMMS GmbH).

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Silicon Science Award for fast LEDs for in-vitro diagnostics

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Core topic

Modular and mobile test systems

Test capabilities are an integral part of all application developments. We research modular test systems that can be adapted flexibly and quickly to new challenges through optimised functional test units.

Lead application

Sensor systems for in-vitro diagnostics

Here we are developing sensor systems for in-vitro diagnostics that enable individual, decentralised health monitoring for all with electronic rapid tests.

Research field

Smart distributed measurement and test systems

Integrated sensor ICs are the heart of sensor and measurement systems like wireless sensors, stationary or handheld devices. We are researching solutions for ever more powerful sensors with more intrinsic intelligence and task allocation in the network.

Contact

Contact

Dipl.-Ing. Michael Meister

Head of Industrial Electronics and Measurement Technology

michael.meister(at)imms.de+49 (0) 3677 874 93 20

Michael Meister is your contact for testing services, the development of test methodologies, and long-term measurements. He answers your questions on Modular and mobile test systems that we develop in our research in Smart distributed measurement and test systems as well as about testing and characterisation of integrated sensor systems. He is responsible for the test equipment at IMMS and will support you in the validation of ASIC and MEMS developments.

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