1712 Ergebnisse
Referenz
  751. Investigations to reduce positioning uncertainty of direct drive systems with aerostatic guiding  
St. Hesse, T. Maaß H.-U. Mohr Ch. Schäffel 6th Euspen International Conference, 28.05-01.06.2006, Baden bei Wien  
Referenz
  752. Investigations on Wafer-Level Testing for Accelerometers by Harmonic Response Measurements  
St. Michael, S. Hering M. Katzschmann MEMUNITY-Workshop 'Testing MEMS at Wafer-Level', 01.03.2006, Halle  
Referenz
  753. Investigations on tip-based large area nanofabrication and nanometrology using a planar nanopositioning machine (NFM-100)  
Jaqueline Stauffenberg, Johannes Belkner Denis Dontsov Ludwig Herzog Steffen Hesse Ivo W Rangelow Ingo Ortlepp Thomas Kissinger Eberhard Manske 2024 Meas. Sci. Technol. 35 085011, DOI: https://doi.org/10.1088/1361-6501/ad4668  
Referenz
  754. Investigations on the Tracking Control and Performance of a Long Stroke Vertical Nanopositioning Drive  
Alex S. Huaman, Stephan Gorges Michael Katzschmann Steffen Hesse Thomas Fröhlich Eberhard Manske Euspen (European Society for Precision Engineering and Nanotechnology) – 22nd International Conference & Exhibition, 30 May – 3 June 2022, Geneva, Switzerland  
Referenz
  755. Investigations on the positioning accuracy of the Nano Fabrication Machine (NFM-100)  
Jaqueline Stauffenberg, Ingo Ortlepp Ulrike Blumröder Denis Dontsov Christoph Schäffel Mathias Holz Ivo W. Rangelow Eberhard Manske tm - Technisches Messen. 2021, 88(9): 581-589. DOI: https://doi.org/10.1515/teme-2021-0079  
Referenz
  756. Investigations of metal systems in a silicon ceramic composite substrate for electrical and thermal contacts as well as associated mounting aspects  
M. Fischer, T. Welker B. Leistritz S. Gropp C. Schäffel M. Hoffmann J. Müller Ceramic Interconnect and Ceramic Microsystems Technologies, Additional Conferences (Device Packaging, HiTEC, HiTEN, & CICMT): May 2016, Vol. 2016, No. CICMT, pp. 000107-000110, DOI: http://dx.doi.org/10.4071/2016CICMT-WA22  
Referenz
  757. Investigation of thermal and non-linear effects on the performance of the power amplifier - BAW filter - chain in a LTE transmitter  
Uwe Stehr, J. Stegner V. Chauhan V. Silva R. Weigel A. Hagelauer Astrid Frank Steffen Michael M. A. Hein 2018 IEEE International Ultrasonics Symposium, IUS 2018, 22-25 October 2018, Kobe, Japan  
Referenz
  758. Investigation of distance measurement reproducibility for a long-range nanopositioning machine combined with a laser focus sensor  
Davi Anders Brasil, Steffen Hesse Michael Katzschmann Ludwig Herzog Thomas Fröhlich Thomas Kissinger 20th International Conference on Precision Engineering (ICPE2024), Sendai, Japan, October 23-26, 2024  
Referenz
  759. Investigation of detectors for optical pick-up systems for DVD applications  
J. Klein, St. Lange session of the conference SENOR 2003, Mai 2003  
Pressemitteilungen
  760. Internationale Konferenzen zu Methoden für den Entwurf integrierter Schaltungen  
Wissenschaftlicher Nachwuchs aus der Elektrotechnik besucht Erfurt virtuell  
Suchergebnis 751 bis 760 von 1712