IMMS - Search

Reference

971. INSPECT – Mikroelektronische Diagnostikplattformen für die personalisierte Krebsforschung und Mikro-Bioreaktoren

Autorenkollektiv, RIS3 Jahresveranstaltung, Session 3, Innovationsfelder „IKT, innovative und produktionsnahe Dienstleistungen“ und „Gesundes Leben und Gesundheitswirtschaft“ 28. September 2017, Erfurt

Reference

972. Instandhaltungstaugliches Messgerät

Dipl.-Ing. Paul Büschel, Prof. Dr.-Ing. Axel Sikora Dipl.-Inf. (FH) Manuel Schappacher Dr.-Ing. Tino Hutschenreuther Dipl.-Inf. Thomas Elste Dipl.-Ing. Sebastian Uziel Studie Nr. 10 / 2015, Abschlussbericht, DFAM, Deutsche Forschungsgesellschaft für Automatisierung und Mikroelektronik e. V., ISBN-Nr.: 978-3-8163-0676-4

Service for R&D

973. Integrated Circuits

For our ASIC developments, we involve in-house test engineers and manufacturing partners right from the start. Photograph: IMMS.

Service for R&D: Integrated Circuits. We offer the design and realisation of application-specific integrated circuits (ASICs) in CMOS, BiCMOS and SOI technologies. We achieve well-performing ASICs with our first runs (first-time right silicon).

Reference

974. Integrated Planar 6-DOF Nanopositioning System

Stephan Gorges, Steffen Hesse Christoph Schäffel I. Ortlepp E. Manske E. Langlotz D. Dontsov 2019 11th IFAC Symposium on Nonlinear Control Systems (NOLCOS 2019), 4 - 6 September 2019, Vienna, Austria , IFAC-PapersOnLine, Volume 52, Issue 15, 2019, Pages 313-318, ISSN 2405-8963, DOI: https://doi.org/10.1016/j.ifacol.2019.11.693

Reference

975. Integrated planar precision drives

Ch. Schäffel, 6. Deutsch-Polnischer Workshop, Ilmenau, Juli 2007, Ilmenau

Research field

976. Integrated sensor systems

Design of an integrated sensor system that is manufactured as a silicon chip using commercial semiconductor technology. Photo: IMMS.

Research field: Integrated sensor systems. Here we investigate miniaturised systems manufactured in semiconductor technology consisting of microelectronic components for sensors applications, as well as methods to design these highly complex systems efficiently and safely.

Reference

977. Integrating Multiple Knowledge-based Automation Methodologies into the A/MS IC Design Flow

Benjamin Prautsch, Ralf Sommer Jürgen Scheible Uwe Eichler Lorenz Renner Till Moldenhauer Matthias Schweikardt Yannick Uhlmann 2024 20th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), Volos, Greece, July 02-05, 2024, pp. 1-4, DOI: https://doi.org/10.1109/SMACD61181.2024.10745465

Reference

978. Integration of 802.15.4 based wireless sensor networks into existing intra-vehicle networks

Silvia Krug, Elena Chervakova Hannes Toepfer Jochen Seitz Second International Scientific Symposium "Sense. Enable. SPITSE.", 22.06.2015 - 03.07.2015, Electrotechnical University "LETI" St. Petersburg, Russia

Reference

979. Integration of Chemiluminescence-based SPARCL Assay on Microfluidic Platform with SPAD-based CMOS Line Sensor IC for Rapid Cytokine Detection in CRS

Benjamin Saft, Biljana Gjurova Pia Scholz Alexander Zimmer Mirjam Skadell Eric Schäfer Susann Allelein POCT Meeting 2024, 17. - 18. April 2024, Leipzig

Reference

980. Integration von nichtflüchtigen Speichern und Analogfunktionen in den Logik CMOS Prozeß

U. Baumann, MEDEA-Abschlußbericht im Projekt (INSAF), (Förderkennzeichen: 01M 2986 B, MEDEA T 502), März 1999