A. Tag,
V. Chauhan
R. Weigel
A. Hagelauer
B. Bader
C. Huck
M. Pitschi
D. Karolewski
IEEE International Ultrasonics Symposium (IUS), 21 – 24 Oct. 2015,
DOI: http://dx.doi.org/10.1109/ULTSYM.2015.0115, ISBN: 978-1-4799-8182-3, Taipei, Taiwan
Christoph Schäffel,
Michael Katzschmann
Hans-Ulrich Mohr
Rainer Glöss
Christian Rudolf
Carolin Walenda
JSME Mechanical Engineering Journal, DOI: http://dx.doi.org/10.1299/mej.15-00111, 16.10.2015
Dienstleistungen Industrielle Elektronik und Messtechnik
Service Range Industrial Electronic and Measurement Technology RF on-wafer measurement Based on many years of experience in circuit design and measurement technology, IMMS designs and implements innovative methods for micro and nano technology. Our services include • Measurements at transistor level • Measurement of modules • Characterization of complex applications • Circuit design / PCB layout. en pm S vel o de SYS TEM in RF ne ss POWER ELECTRONICS on Reliability in application cti High-end semiconductor test…
Elena Chervakova,
Sven Engelhardt
Marco Goetze
Michael Rink
Axl Schreiber
DASIP 2015, Conference on Design & Architectures for Signal & Image Processing, 23.09.2015 - 25.09.2015, Cracow, Poland, (Best-Demo-Night-Award)
Tino Hutschenreuther,
Hendrik Härter
in Elektronik Praxis, September 2015, Seite 38 - 39, online: http://www.elektronikpraxis.vogel.de/messen-und-testen/articles/504598/
