601. Detection of micronewton forces in tribology   M. Scherge, S.I. Ahmed O. Mollenhauer F. Spiller tm - Technisches Messen Heft 7-8/2000  

  602. Determination of yaw angle of mirror origin in a 6-DOF nanopositioning stage   Davi Anders Brasil, Michael Katzschmann Steffen Hesse Ludwig Herzog Thomas Kissinger Thomas Fröhlich International Scientific Symposium on World Interferometry Day 2026, 20. April 2026, Ilmenau, Germany  

  603. Developing and Testing RF modules in CMOS for ISM and SRD Bands using PXI platform   B. Bieske, K.Heinrich 9th International Multi-Conference on Systems, Signals and Devices (SSD), 2012, Chemnitz, 20.03.2012-23.3.2012  

  604. Developing and Testing RF modules in CMOS for ISM and SRD Bands using PXI platform   B. Bieske, K.Heinrich 9th International Multi-Conference on Systems, Signals and Devices (SSD), 2012, Digital Object Identifier: 10.1109/SSD.2012.6197945, http://ieeexplore.ieee.org, IEEE Xplore Digital Library, E-ISBN 978-1-4673-1589-0  

  605. Developing and Testing RF modules in CMOS for ISM Bands using PXI platform   Björn Bieske, Klaus Heinrich Transactions on Systems, Signal & Devices (TSSD), Vol. 8, No. 4, pp. 1-13  

  606. Development of a vertical wafer stage for high vakuum applications   E. Beckert, A. Hoffmann E. Saffert Micro- and Nano-Engineering 2000, September 2000  

  607. Development and validation of a simplified coil model for CFD simulation of a nano-positioning planar drive system   Ina Naujokat, Ludwig Herzog Steffen Hesse Parastoo Salimitari Euspen Special Interest Conference: Precision & Performance 2025, Proceedings: https://www.euspen.eu/euspen-knowledge-base/proceedings-search/#!/event=9944, November 18-20, 2025, Cranfield University, United Kingdom  

  608. Development of a bandwidth measurement for photo diodes   M. Meister, X-FAB Workshop 'Process Development & Characterisation Workshop on Innovation', 15.-16.11.2006, Luisenthal  

  609. Development of a digital SQUID magnetometer for widely varying fields in urban environment   T. Reich, Oktober 2009, Technische Universität Ilmenau  

  610. Development of a vertical wafer stage for high vacuum applications   E. Beckert, 15th Annual Meeting American Society of Precision Engineers (ASPE), Scottsdale, Arizona, USA, Oktober 2000