2138 results
Reference
  581. Optimizing the IoT Performance: A Case Study on Pruning a Distributed CNN  
Eiraj Saqib, Isaac Sánchez Leal Irida Shallari Axel Jantsch Silvia Krug Mattias O'Nils 2023 IEEE Sensors Applications Symposium (SAS), 18-20 July 2023, Ottawa, ON, Canada, July 18-20, 2023, pp. 1-6, DOI: https://doi.org/10.1109/SAS58821.2023.10254054.  
Reference
  582. Optimized Measurement Methods Evaluating Crosstalk in different SOI Technologies  
Björn Bieske, Dagmar Kirsten Michael Frey Andreas Ott 2025 IEEE 22nd International Multi-Conference on Systems, Signals & Devices (SSD), Monastir, Tunisia, 2025, pp. 1315-1321, DOI: https://doi.org/10.1109/SSD64182.2025.10989885  
Reference
  583. Optimization of Analog Circuits with Automatic Device Type Selection  
B. Dimov, V. Boos T. Reich C. Lang E. Hennig R. Sommer Xth International Workshop on Symbolic and Numerical Methods, Modeling and Applications to Circuit Design (SM²ACD'08), pp 44-48, 07.-08. Oktober, Erfurt, 2008  
Reference
  584. Optimization of Analog Circuits with Automatic Device Type Selection  
B. Dimov, V. Boos T. Reich C. Lang E. Hennig R. Sommer Xth International Workshop on Symbolic and Numerical Methods, Modeling and Applications to Circuit Design (SM²ACD'08), 7.-8. Oktober 2008, Erfurt, Germany  
Reference
  585. Optimierung industrieller Echtzeitanwendungen auf Basis von Open-Source-Technologien  
S. Schramm, 4. Innovationsforum 'Software Saxony', 23.04.2010, Dresden  
Reference
  586. Optimierung der Bewässerung im Obstbau durch Sensorikeinsatz  
Martin Penzel, Silvia Krug Regionalkonferenz EXPRESS, 22. - 23. September 2021, Weingut Schloss Proschwitz, Meißen  
Reference
  587. Optical, mechanical and electro-optical design of an interferometric test station for massive parallel inspection of MEMS and MOEMS  
K.Gastinger, K.H.Haugholt M. Kujawinska M.Jozwik C. Schäffel S. Beer Paper 7389-56, SPIE Europe Optical Metrology, 14.- 18. Juni 2009, München  
Reference
  588. Optical, mechanical and electro-optical design of an interferometric test station for massive parallel inspection of MEMS and MOEMS  
Dr. Ch. Schäffel, S. Michael B. Leistritz M. Katzschmann N. Zeike K. Gastinger M. Kujawinska M. Jozwik S. Beer 10. International Conference of the Euspen Society for Precision Engineering & Nanotechnology, 31.05.2010-04.06.2010, Delft, Niederlanden  
Reference
  589. Optical detected magnetic resonance (ODMR) of ASi-Sii defects: case of acceptor indium  
Kevin Lauer, Bernd Hähnlein Mario Bähr Kai Kühnlenz Philipp Kellner Dirk Schulze Stefan Krischok Alexander Rolapp Christian Möller Thomas Ortlepp 4th DRD3 week on Solid State Detectors R&D, 10. –14. November 2025, CERN, Zürich, Schweiz  
Reference
  590. Operation and performance evaluation of vertical nanopositioners for 10 mm stroke in a 3D lift and tilt test setup  
Steffen Hesse, Michael Katzschmann Alex S. Huaman Stephan Gorges Eberhard Manske euspen – Special Interest Group Meeting: Precision Motion Systems & Control, 15th – 16th November 2022, s-Hertogenbosch, The Netherlands, NL  
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