2149 results
Reference
  561. Peter Chall, ALSI  
”The achieved extreme precision, reproducibility and productivity of the laser dicing technology are at the forefront of international excellence. The close cooperation with IMMS leads to innovative developments, which is a basis that we can count on to expand our position as a leading technology provider.“  
Event
  562. PES 2015  
Lecture at the ”12th International Conference on Applied Electromagnetics“  
Reference
  563. Performance of SpaceTime Processing for ISI- and CCI-Suppression in Industrial Scenarios  
U. Trautwein, D. Hampicke G. Sommerkorn R.S. Thomä IEEE Annual Vehicular Technology Conference 2000, 15.-18.5.2000, Tokyo, Japan  
Reference
  564. Performance of SpaceTime Processing for ISI- and CCI-Suppression in Industrial Scenarios  
U. Trautwein, D. Hampicke G. Sommerkorn R.S. Thomä In: Proc. 51st IEEE Vehicular Technology Conference, Band 3, S. 1894-1898. VTC 2000-Springer Tokyo, 15.-18.5.2000  
Reference
  565. Perforated plates of inertial sensors – modeling by effective material properties  
Steffen Michael, Astrid Frank G. Hölzer G. Lorenz EUROSENSORS 2014, the 28th European Conference on Solid-State Transducers, in Procedia Engineering, Volume 87, 2014, Pages 480 – 483, http://www.sciencedirect.com, DOI: http://dx.doi.org/10.1016/j.proeng.2014.11.400  
Reference
  566. Patents  
Patents Here you will find disclosed patent applications and granted patents for which IMMS is the owner or co-owner.  
Reference
  567. Passive 350 GHz Video Imaging Systems for Security Apllications  
E. Heinz, T. May D. Born G. Zieger S. Anders V. Zakosarenko H.-G. Meyer C. Schäffel Journal of Infrared, Millimeter and Terahertz Waves manuscript No., DOI: http://dx.doi.org/10.1007/s10762-015-0170-8, Online ISSN: 1866-6906, Print ISSN: 1866-6892, Volume 36, Number 7, July 2015  
About us
  568. Partners  
Partners: We involve innovative, certified manufacturing partners to cover the value chain in R&D projects. You will also find an overview of our project partners from science and industry and information on how you can become a partner.  
Reference
  569. Parasitic Symmetry at a Glance: Uncovering Mixed-Signal Layout Constraints  
Georg Gläser, Benjamin Saft Ralf Sommer FAC 2017, Frontiers in Analog CAD, Frankfurt on the Main, Germany, 21-22 July 2017, pp. 1-6. URL: http://ieeexplore.ieee.org/document/8011279/  
Reference
  570. Parametric Measurement Unit und Pinelektronik für ein modulares Mixed Signal Testsystem  
A. Rolapp, R. Paris 21. Workshop 'Testmethoden und Zuverlässigkeit von Schaltungen und Systemen' (TuZ 2009), Tagungsband S. 86, 15. - 17. Februar 2009, Bremen  
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