IMMS - Search

Reference

481. Parameter Identification of MEMS Membrane and Beam Structures by Modal Analysis and Dynamic Measurements

St. Michael, ANSYS Conference & 27. CADFEM Users' Meeting, 18. - 20. November 2009, Leipzig

Reference

482. Parameter Identification of Membrane Structures - Chances and Limitations

S. Michael, SSI 2010 - MEMUNITY Workshop, 24.03.2010, Grenoble, France

Reference

483. Ovutinin

Mit einem neuen Ovulationsschnelltest soll die fruchtbare Phase bis zu 6 Tage vor dem Eisprung bestimmt werden. Image by Serhii Kuch from Pixabay.

For an innovative rapid test for fertility diagnostics, IMMS is developing an image sensor for time-resolved fluorescence measurement.

About us

484. Organisation

Organigram of IMMS. Photograph: Kvalifik, Unsplash.

Organisation: Here you will find our organisation chart, information on the Institute’s management, our departments, our supervisory board and our scientific advisory board, as well as contact details.

Reference

485. OPV und TIA-Optimierung mit WiCkeD

V. Boos, St. Lange Workshop: 'Effizienzsteigerung und Ausbeuteverbesserung im analogen Schaltungsentwurf mit WiCkeD, 20.01.2004, Erfurt

Reference

486. OptoMed vacuum air bearings

Set-up consisting of metal pipes, cables and measuring devices on a laboratory bench.

Air bearings in high-precision vacuum applications? Together with our partners, we are exploring the technical feasibility of this (apparent) contradiction.

Reference

487. OPTOELECTRONICS BiCMOS OEIC for optical storage systems

M. Heise, K. Kieschnick H. Pleß H. Zimmermann Electronics Letters, September 1998

Reference

488. Optischer Sensor und Verstärker in BiCMOS

M. Heise, H. Pleß Design & Elektronik, September 1998

Reference

489. Optische Kommunikation nach IEEE 1394b über POF

H.Töpfer, 09.03.2004, 18. Fachgruppentreffen ITG-FG 5.4.1. Optische Polymerfasern, Erfurt

Reference

490. Optimizing the IoT Performance: A Case Study on Pruning a Distributed CNN

Eiraj Saqib, Isaac Sánchez Leal Irida Shallari Axel Jantsch Silvia Krug Mattias O'Nils 2023 IEEE Sensors Applications Symposium (SAS), 18-20 July 2023, Ottawa, ON, Canada, July 18-20, 2023, pp. 1-6, DOI: https://doi.org/10.1109/SAS58821.2023.10254054.