1722 results
Reference
  471. Patents  
[Translate to English:] Patents: Here you will find disclosed patent applications and granted patents for which IMMS is first patent assignee or co-holder.  
Reference
  472. Passive 350 GHz Video Imaging Systems for Security Apllications  
E. Heinz, T. May D. Born G. Zieger S. Anders V. Zakosarenko H.-G. Meyer C. Schäffel Journal of Infrared, Millimeter and Terahertz Waves manuscript No., DOI: http://dx.doi.org/10.1007/s10762-015-0170-8, Online ISSN: 1866-6906, Print ISSN: 1866-6892, Volume 36, Number 7, July 2015  
About us
  473. Partners  
Partners: We involve innovative, certified manufacturing partners to cover the value chain in R&D projects. You will also find an overview of our project partners from science and industry and information on how you can become a partner.  
Reference
  474. Parasitic Symmetry at a Glance: Uncovering Mixed-Signal Layout Constraints  
Georg Gläser, Benjamin Saft Ralf Sommer FAC 2017, Frontiers in Analog CAD, Frankfurt on the Main, Germany, 21-22 July 2017, pp. 1-6. URL: http://ieeexplore.ieee.org/document/8011279/  
Reference
  475. Parametric Measurement Unit und Pinelektronik für ein modulares Mixed Signal Testsystem  
A. Rolapp, R. Paris 21. Workshop 'Testmethoden und Zuverlässigkeit von Schaltungen und Systemen' (TuZ 2009), Tagungsband S. 86, 15. - 17. Februar 2009, Bremen  
Reference
  476. Parametric Measurement Unit and Pin Electronics for modular Mixed Signal Test Systems  
A. Rolapp, R. Paris Chip, Packaging, Design, Simulation and Test - International Conference, Workshop and Table-top Exhibition 'Semiconductor Conference Dresden 2009' (SCD 2009), 29. - 30. April 2009, Dresden  
Reference
  477. Parameteridentifikation von MEMS auf Wafer-Level mittels dynamischer Messungen  
S. Michael, R. Paris S. Hering 6. ITG/GI/GMM-Workshop Multi-Nature Systems: Entwicklung von Systemen mit elektronischen und nichtelektronischen Komponenten, Februar 2007, Erfurt  
Reference
  478. Parameter Identification of Piezoelectric AlGaN/GaN Beam Resonators by Dynamic Measurements  
St. Michael, K. Brueckner F. Niebelschuetz K. Tonisch C. Schäffel 10th EuroSimE 2009, 26.-28. April, Delft, Netherlands  
Reference
  479. Parameter Identification of MEMS Membrane and Beam Structures by Modal Analysis and Dynamic Measurements  
St. Michael, ANSYS Conference & 27. CADFEM Users' Meeting, 18. - 20. November 2009, Leipzig  
Reference
  480. Parameter Identification of Membrane Structures - Chances and Limitations  
S. Michael, SSI 2010 - MEMUNITY Workshop, 24.03.2010, Grenoble, France  
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