IMMS - Search

Event

471. CHANTS 2017

12th Workshop on Challenged Networks, Co-located with ACM MobiCom 2017

Reference

472. Characterizing Dynamics of MEMS Devices on Wafer Level Using Optical Measurement Techniques

Sebastian Giessmann, Steffen Michael Eric Lawrence Dr. Heinrich Steger Commercial Micro Manufacturing International Magazine (CMM Magazine), 08-2023, VOL 16 NO. 3, pp. 30-39

Reference

473. Charakterisierung und Test von elektrostatischen Energieharvestern – Eine neue Schaltungstopologie für exaktere Messungen

Björn Bieske, Gerrit Kropp 29. GI/GMM/ITG-Workshop, Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ 2017), 5.- 7. März 2017, Lübeck

Reference

474. Charakterisierung von HF-Zellen verschiedener Technologien unter Nutzung modularer PXI-Testsysteme

B. Bieske, K. Gille 22nd ITG/GI/GMM Workshop 'Testmethoden und Zuverlässigkeit von Schaltungen und Systemen' (TuZ 2010), 28.02.-02.03.2010, Paderborn

Reference

475. Charakterisierung, Optimierung und PEEC-Modellierung für einen Signalübertragungsabschnitt in Multi-Chip-Modulen

H. Töpfer, Workshop Entwurf von integrierten Analog-/Mixed-Signal-/HF-Schaltungen, 10.05.2007, Dresden

Event

476. Chipdesign Germany

With Ilmenau TU, we have developed an AI-based anomaly detection method to automatically detect non-proven and potentially faulty locations in layouts. Our relatetd plugin for the free design tool KiCad is available on GitHub. Source: IMMS.

Eine Veranstaltung der Designinitiative Mikroelektronik

Reference

477. Christian Paintz, Melexis

“Particularly in the evaluation of measurement data, IMMS has impressively demonstrated that a learning algorithm is on a par with manual evaluation – while saving a great deal of time. We are also continuing to pursue methods for circuit and layout analysis, as we see great research and application potential here as well.”

Event

478. CIM 2025

Complex construction of glass, metal, electronic and pneumatic components on a granite block.

22nd International Metrology Congress

Event

479. CiS Workshop 2023

ANSYS simulation of MEMS structures for a model library to design novel multisensor applications. Photograph: IMMS.

Workshop Simulation & Design 2023 at CiS Forschungsinstitut für Mikrosensorik

Event

480. CIVEMSA 2022

The IEEE International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications