IMMS - Search

Reference

351. Automated Generation of System-Level AMS Operating Condition Checks: Your Model’s Insurance Policy

Georg Gläser, Martin Grabmann Gerrit Kropp Andreas Fürtig 2017 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), Giardini Naxos, 12-15 June 2017, pp. 1-4. DOI: https://doi.org/10.1109/SMACD.2017.7981567

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352. Automatic Annotation of Properties to ESL SystemC Models and Accelerated Simulation

Georg Gläser, Eckhard Hennig Specification and Design Languages (FDL), 2015 Forum on, 14-16 Sept., Barcelona, Spain

Reference

353. Automatic Nonlinear Behavioral Model Generation using Sequential Equation Structures

D. Platte, R. Sommer J. Broz A. Dreyer T. Halfmann E. Barke Proc. 9th International Workshop on Symbolic Methods and Applications to Circuit Design (SMACD'06), Florenz, Italien, Okt. 2006

Reference

354. Automatic Nonlinear Behavioral Model Generation Using Symbolic Circuit Analysis, in Design of Analog Circuits through Symbolic Analysis

Ralf Sommer, Eckhard Hennig Gregor Nitsche J. Broz P. Schwarz in Design of Analog Circuits through Symbolic Analysis, M. Fakhfakh, E. Tlelo-Cuautle, and F. V. Fernández, Eds., Bentham Science Publishers, 2012, ch. 12, Pages 305-341, http://www.eurekaselect.com/101990/volume/1

Reference

355. Automatische Ausführung einer standardisierten, ATML basierten Testspezifikation mit paralleler Simulation

I. Gryl, D. Glaser P. Lu Z. Kiss Passau: 23. GI/GMM/ITG Workshop 'Testmethoden und Zuverlässigkeit von Schaltungen und Systemen' (TuZ 2011)

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356. Automatische nichtlineare Verhaltensmodellgenerierung mit sequentieller Gleichungsstruktur

D. Platte, R. Sommer J. Broz A. Dreyer T. Halfmann E. Barke in Proc. ANALOG 2006, Dresden, Sept. 2006

Reference

357. Automatisiertes Testen mikroelektronischer Schaltungen – Fuzzing findet Bugs in Hardware

Henning Siemen, Jonas Lienke Georg Gläser Elektronik, 21.2023, 18. Oktober 2023, Seite 64 - 67, ePaper: https://wfm-publish.blaetterkatalog.de/frontend/mvc/catalog/by-name/ELE?catalogName=ELE2321D

Reference

358. Awards

Awards: We are very proud of the work of our colleagues and are delighted with the awards listed here for their innovations and publications at international conferences.

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359. BASe-Kit - Ein mobiles Messsystem für die Gebäudeautomation, BASe-Kit - A mobile measurement system for building automation

S. Engelhardt, E. Chervakova W. Kattanek T. Rossbach Dr. A. Schreiber M. Götze SENSOR+TEST 2010, 18.-20.05.2010, 17. Internationale Fachmesse für Sensorik, Mess- und Prüftechnik

Reference

360. Basic Design Challenges for Logical Gates Using Non-Standard Technologies or Circuit Concept Approaches

A. Amar, W. Glauert 3. GMM/GI/ITG-Fachtagung 'Zuverlässigkeit und Entwurf', Stuttgart, 21.-23.09.2009