341. Automated Behavioral Modeling and Analytical Model-order Reduction by Application of Symbolic Circuit Analysis for Multiphysical Systems   R. Sommer, Proceedings EUROSIM 2007, 6th Congress on Modeling and Simulation, 9.-13. September 2007, Ljubljana (Slowenien)  

  342. Automated Design Methodology for Electromagnetic Energy Harvesters   Bianca Leistritz, Ludwig Herzog Sensors 2025, 25, 3358, DOI: https://doi.org/10.3390/s25113358  

  343. Automated Generation of System-Level AMS Operating Condition Checks: Your Model’s Insurance Policy   Georg Gläser, Martin Grabmann Gerrit Kropp Andreas Fürtig 2017 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), Giardini Naxos, 12-15 June 2017, pp. 1-4. DOI: https://doi.org/10.1109/SMACD.2017.7981567  

  344. Automatic Annotation of Properties to ESL SystemC Models and Accelerated Simulation   Georg Gläser, Eckhard Hennig Specification and Design Languages (FDL), 2015 Forum on, 14-16 Sept., Barcelona, Spain  

  345. Automatic Nonlinear Behavioral Model Generation using Sequential Equation Structures   D. Platte, R. Sommer J. Broz A. Dreyer T. Halfmann E. Barke Proc. 9th International Workshop on Symbolic Methods and Applications to Circuit Design (SMACD'06), Florenz, Italien, Okt. 2006  

  346. Automatic Nonlinear Behavioral Model Generation Using Symbolic Circuit Analysis, in Design of Analog Circuits through Symbolic Analysis   Ralf Sommer, Eckhard Hennig Gregor Nitsche J. Broz P. Schwarz in Design of Analog Circuits through Symbolic Analysis, M. Fakhfakh, E. Tlelo-Cuautle, and F. V. Fernández, Eds., Bentham Science Publishers, 2012, ch. 12, Pages 305-341, http://www.eurekaselect.com/101990/volume/1  

  347. Automatische Ausführung einer standardisierten, ATML basierten Testspezifikation mit paralleler Simulation   I. Gryl, D. Glaser P. Lu Z. Kiss Passau: 23. GI/GMM/ITG Workshop 'Testmethoden und Zuverlässigkeit von Schaltungen und Systemen' (TuZ 2011)  

  348. Automatische nichtlineare Verhaltensmodellgenerierung mit sequentieller Gleichungsstruktur   D. Platte, R. Sommer J. Broz A. Dreyer T. Halfmann E. Barke in Proc. ANALOG 2006, Dresden, Sept. 2006  

  349. Automatisiertes Testen mikroelektronischer Schaltungen – Fuzzing findet Bugs in Hardware   Henning Siemen, Jonas Lienke Georg Gläser Elektronik, 21.2023, 18. Oktober 2023, Seite 64 - 67, ePaper: https://wfm-publish.blaetterkatalog.de/frontend/mvc/catalog/by-name/ELE?catalogName=ELE2321D