IMMS - Search

Reference

241. A Large-Travel Hybrid Metrology Platform Integrating Laser Focus Sensor and Atomic Force Microscopy

Davi Anders Brasil, Michael Katzschmann, Steffen Hesse, Ludwig Herzog, Thomas Fröhlich, Thomas Kissinger, Christian-Albrechts-Universität, Kiel, Germany 2026 Messtechnische Symposium des Arbeitskreises der Hochschullehrer für Messtechnik e.V. (AHMT) tm - Technisches Messen

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242. A Low-Voltage Low-Power CMOS Time-Domain Temperature Sensor Accurate To Within [-0.1,+0.5]˚C From -40˚C To 125˚C

Jun Tan, Alexander Rolapp, Eckhard Hennig, Ishigaki, Japan 2014 2014 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)

Reference

243. A method for dynamic interferometric characterization of air bearings for nanopositioning stages

Steffen Hesse, Michael Katzschmann, Alex S. Huaman, Parastoo Salimitari, Ludwig Herzog, Technische Universität Ilmenau, Ilmenau 2025 Internationales Wissenschaftliches Symposium zum Welttag der Interferometrie

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244. A methodology for high-level design of machine vision systems using SystemC

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245. A Modular Platform to Build Task Specific IoT Network Solutions for Agriculture and Forestry

Silvia Krug, Marco Götze, Sören Schneider, Tino Hutschenreuther, Pisa, Italy 2023 2023 IEEE International Workshop on Metrology for Agriculture and Forestry (MetroAgriFor)

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246. A New Low Voltage Bandgap Reference Topology

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247. A new tool for industrial tribology - Filling the gap between macro- and nano-tribology

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248. A new XY linear stage for Nano technology - The stage can draw 3 diameter true circle

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249. A novel low leakage EEPROM cell for application in an extended temperature range (-40°C up to 225°C)

Reference

250. A novel low leakage EEPROM cell for application in an extended temperature range (-40°C up to 225°C)