1779 results
Reference
  191. TESCA  
The drive system for a terahertz camera allows security checks whereby people can be effectively scanned for hidden objects as they simply pass by.  
Reference
  192. Terminalsystem 2.0: Neue, flexible Möglichkeiten der Kombination von PXI-Testerressourcen bis 1 GHz  
Björn Bieske, Ludwig Kircher Alexander Rolapp 33. GI/GMM/ITG-Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ 2021), 22. Februar 2021, online  
Reference
  193. Temporal Decoupling with Error-Bounded Predictive Quantum Control  
Georg Gläser, Gregor Nitsche Eckhard Hennig Languages, Design Methods and Tools for Electronic System Design, Selected Contributions from FDL 2015, ISBN 978-3-319-31722-9, pages 125-150  
Reference
  194. Temporal Decoupling with Error-Bounded Predictive Quantum Control  
Georg Gläser, Gregor Nitsche Eckhard Hennig Specification and Design Languages (FDL), 2015 Forum on, 14-16 Sept. 2015, Barcelona, Spain, (Best-Paper-Award), DOI: http://dx.doi.org/10.1109/FDL.2015.7306358, Print ISBN - IEEE Xplore 978-1-4673-7735-5  
Reference
  195. Temperaturfeldberechnungen in der Mikromechanik  
K. Rettig, 16. CAD-FEM User Meeting, Bad Neuenahr-Ahrweiler, Oktober 1998  
Reference
  196. Teilprojekt A5 - Nanopositioniersysteme großer Bewegungsbereiche  
Steffen Hesse, Forschungsergebnisse 2002-2013, Abschlusspräsentation SFB 622 Nanopositionier- und Nanomessmaschinen, Ilmenau, 29.05.2013  
Reference
  197. Teilprojekt A5 - Nanopositioniersysteme großer Bewegungsbereiche  
Steffen Hesse, Forschungsergebnisse 2002-2013, Abschlusspräsentation SFB 622 Nanopositionier- und Nanomessmaschinen, Ilmenau, 29.05.2013  
Reference
  198. TEEMSC – Trainable Energy Efficient Machine Diagnosis using Singular Values and Canonical Crosscorrelation  
Rick Pandey, Sebastian Uziel Tino Hutschenreuther Silvia Krug IEEE International Workshop on Metrology for Industry 4.0 and IoT, Florence, Italy, May 29-31, 2024, DOI: https://doi.org/10.1109/MetroInd4.0IoT61288.2024.10584173  
Reference
  199. Technology Setup for WiCkeD in X-FAB CMOS and BiCMOS Process for Automotive and Sensor Applications  
V. Boos, MunEDA User Group Meeting Europe 2007, 25.-26. September 2007, München  
Reference
  200. Technology and Design of RSFQ Circuits for Operation at High Temperatures  
D. Cassel, Th. Ortlepp B. Kuhlmann R. Dittmann H. Töpfer Siegel F.H. Uhlmann 336. WE-Heraeus-Seminar Processing of Quantum Information in RSFQ Circuits and Qubits, 29.11.-1.12. 2004, Bad Honnef  
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