IMMS - Search

Press release

1691. CMOS image sensor platform for time-resolved fluorescence measurements with europium

Quantitative readout of test strips demonstrates broad applicability in in-vitro diagnostics

Reference

1692. Clock Gate Insertion with a Yosys-based Netlist Modification Tool

Manuel Jirsak, Adrian Pitterling Jonas Lienke Georg Gläser FPGA Ignite Summer School, 5. - 9. August 2024, Heidelberg, Germany

Event

1693. CIVEMSA 2022

The IEEE International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications

Event

1694. CiS Workshop 2023

ANSYS simulation of MEMS structures for a model library to design novel multisensor applications. Photograph: IMMS.

Workshop Simulation & Design 2023 at CiS Forschungsinstitut für Mikrosensorik

Event

1695. CIM 2025

Complex construction of glass, metal, electronic and pneumatic components on a granite block.

22nd International Metrology Congress

Reference

1696. Christian Paintz, Melexis

“Particularly in the evaluation of measurement data, IMMS has impressively demonstrated that a learning algorithm is on a par with manual evaluation – while saving a great deal of time. We are also continuing to pursue methods for circuit and layout analysis, as we see great research and application potential here as well.”

Event

1697. Chipdesign Germany

With Ilmenau TU, we have developed an AI-based anomaly detection method to automatically detect non-proven and potentially faulty locations in layouts. Our relatetd plugin for the free design tool KiCad is available on GitHub. Source: IMMS.

Eine Veranstaltung der Designinitiative Mikroelektronik

Reference

1698. Charakterisierung, Optimierung und PEEC-Modellierung für einen Signalübertragungsabschnitt in Multi-Chip-Modulen

H. Töpfer, Workshop Entwurf von integrierten Analog-/Mixed-Signal-/HF-Schaltungen, 10.05.2007, Dresden

Reference

1699. Charakterisierung von HF-Zellen verschiedener Technologien unter Nutzung modularer PXI-Testsysteme

B. Bieske, K. Gille 22nd ITG/GI/GMM Workshop 'Testmethoden und Zuverlässigkeit von Schaltungen und Systemen' (TuZ 2010), 28.02.-02.03.2010, Paderborn

Reference

1700. Charakterisierung und Test von elektrostatischen Energieharvestern – Eine neue Schaltungstopologie für exaktere Messungen

Björn Bieske, Gerrit Kropp 29. GI/GMM/ITG-Workshop, Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ 2017), 5.- 7. März 2017, Lübeck