IMMS - Search

Reference

161. The sound of ultrasound

Nicki Bader, Peter Holstein Hans-Joachim Münch Sebastian Uziel Tino Hutschenreuther Steffen Seitz 26th International Congress on Sound and Vibration (ICSV26), 7 - 11 July 2019, Montréal, Canada, ISBN: 9781510892699

Reference

162. The Rapid Single-Flux Quantum Technology - a Promising Alternative for the Development of High-Performance Digital Electronics

B. Dimov, T. Ortlepp H. F. Uhlmann Kleinheubacher Tagung 2007, 24.-27. September 2007, Miltenberg

Reference

163. The asynchronous rapid single-flux quantum electronics - a promising alternative for the development of high-performance digital circuits

B. Dimov, Th. Ortlepp V. Mladenov S. Terzieva F. H.Uhlmann Advances in Radio Science, Kleinheubacher Berichte, 6, 1-9, 2008

Reference

164. The angle dependent ΔE effect in TiN/AlN/Ni micro cantilevers

Bernd Hähnlein, Maria Kellner Maximilian Krey Alireza Nikpourian Jörg Pezoldt Steffen Michael Hannes Töpfer Stefan Krischok Katja Tonisch Sensors and Actuators A: Physical, Volume 345, 2022, 113784, ISSN 0924-4247, DOI: https://doi.org/10.1016/j.sna.2022.113784

Press release

165. The 2016 Annual Report is available

We connect the digital to the analog world. Photograph: IMMS.

Here you can find the contents in brief and the entire report which is linked to further information, related articles and videos.

Reference

166. Text messages

Text messages on 25 years of IMMS: Here you will find texts sent to us by our partners for our 25th anniversary. There are also many references to concrete projects and joint product developments. Many thanks!

Reference

167. Testsystem für die Charakerisierung analoger und digitaler Strukturen – Mixed-Signal-Analyse wird mobiltauglich

Tom Reinhold, Elektronik, 24.2024, 26. November 2024, Seite 70 - 73, ePaper: https://wfm-publish.blaetterkatalog.de/frontend/mvc/catalog/by-name/ELE?catalogName=ELE2424D

Reference

168. Teststrategien für HF-ICs vom Labor zur Produktion

B. Bieske, P. Witzenhausen 18. ITG Testworkshop 'Testmethoden und Zuverlässigkeit von Schaltungen und Systemen', Titisee, 12.-14.03.2006

Reference

169. Testschaltung für MEMS-Inertialsensoren-Auswerte-ASIC

Roman Paris, Peter Kornetzky Jenny Klaus 28. GMM/GI/ITG Workshop – Testmethoden und Zuverlässigkeit von Schaltungen, TuZ 2016, 06.03.2016 - 08.03.2016, Siegen, Germany

Reference

170. Testmöglichkeiten auf Waferebene am IMMS

M. Meister, 49. Mikroelektronik-Seminar, 05.05.2010, Erfurt