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Reference

1631. MIRO

Unripe cherry on the tree, clutched by a metal construction.

Future-proof regional fruit growing through systematic data collection (digital twin) and data exchange along the value chain

Reference

1632. Enhancing Apple Cultivar Classification Using Multiview Images

Silvia Krug, Tino Hutschenreuther J. Imaging 2024, 10, 94. DOI: https://doi.org/10.3390/jimaging10040094

Reference

1633. Integration of Chemiluminescence-based SPARCL Assay on Microfluidic Platform with SPAD-based CMOS Line Sensor IC for Rapid Cytokine Detection in CRS

Benjamin Saft, Biljana Gjurova Pia Scholz Alexander Zimmer Mirjam Skadell Eric Schäfer Susann Allelein POCT Meeting 2024, 17. - 18. April 2024, Leipzig

Career

1634. Internships, jobs, BSc/MSc subjects

Internships, jobs, BSc/MSc subjects: During your studies, you can get involved in ongoing research projects. Go to the limits of what is technically feasible and enter new ground together with us. We offer many practice-oriented topics as internships, bachelor and master theses.

Reference

1635. Investigations on tip-based large area nanofabrication and nanometrology using a planar nanopositioning machine (NFM-100)

Jaqueline Stauffenberg, Johannes Belkner Denis Dontsov Ludwig Herzog Steffen Hesse Ivo W Rangelow Ingo Ortlepp Thomas Kissinger Eberhard Manske 2024 Meas. Sci. Technol. 35 085011, DOI: https://doi.org/10.1088/1361-6501/ad4668

Reference

1636. Effect of spent mushroom compost mulch and irrigation treatment on growth, yield and fruit quality of sweet cherry in a summer-dry climate

Martin Penzel, Claudia Kuhaupt Maria Bamberg Silvia Krug European Horticulture Congress EHC, Symposia „Fruit Production Systems for Sustainable and Resilient Development“, Bucharest, Romania, May 12-16, 2024

Reference

1637. TEEMSC – Trainable Energy Efficient Machine Diagnosis using Singular Values and Canonical Crosscorrelation

Rick Pandey, Sebastian Uziel Tino Hutschenreuther Silvia Krug IEEE International Workshop on Metrology for Industry 4.0 and IoT, Florence, Italy, May 29-31, 2024, DOI: https://doi.org/10.1109/MetroInd4.0IoT61288.2024.10584173

Reference

1638. A Charge Pump System with Controlled Input Impedance for Optimized RFID Energy Harvesting

Rohit Kesharwani, Andre Jäger Martin Grabmann David Schreiber Georg Gläser Hani Abdullah Eric Schäfer 2024 IEEE International Conference on RFID (RFID), Boston, MA, USA, June 4-6, 2024, DOI: https://doi.org/10.1109/RFID62091.2024.10582749

Reference

1639. VE-ARiS: Elektronischer Knowhow-Schutz für innovative Sensorsysteme. Abwehr von Reserve-Engineering auf IC-Ebene

Projektkonsortium VE-ARiS (iC-Haus GmbH, Wachendorff Automation GmbH & Co. KG, IMMS GmbH), Tage der vertrauenswürdigen Elektronik 2024, 4. - 5. Juni 2024, München

Reference

1640. What The Fuzz (WTF): A Framework for Fuzz Testing ASIC Designs

Henning Siemen, Georg Gläser Tage der vertrauenswürdigen Elektronik 2024, 4. - 5. Juni 2024, München