1581. Out-of-Band Over-The-Air-Update for LoRaWAN-based Sensor Networks using BLE   Florian Jung, Silvia Krug Tino Hutschenreuther 2025 IEEE International Workshop on Metrology for Agriculture and Forestry (MetroAgriFor), October 28-30, 2025, Bologna, Italy  

  1584. Parameter extraction such as layer thickness and stress at wafer level for process monitoring in semiconductor manufacturing   , Microstructure User Meeting 2026, Symposium zur optischen Schwingungsmessung, 19. März 2026, Waldbronn, Germany  

  1585. Parameter Identification of Membrane Structures - Chances and Limitations   S. Michael, SSI 2010 - MEMUNITY Workshop, 24.03.2010, Grenoble, France  

  1586. Parameter Identification of MEMS Membrane and Beam Structures by Modal Analysis and Dynamic Measurements   St. Michael, ANSYS Conference & 27. CADFEM Users' Meeting, 18. - 20. November 2009, Leipzig  

  1587. Parameter Identification of Piezoelectric AlGaN/GaN Beam Resonators by Dynamic Measurements   St. Michael, K. Brueckner F. Niebelschuetz K. Tonisch C. Schäffel 10th EuroSimE 2009, 26.-28. April, Delft, Netherlands  

  1588. Parameteridentifikation von MEMS auf Wafer-Level mittels dynamischer Messungen   S. Michael, R. Paris S. Hering 6. ITG/GI/GMM-Workshop Multi-Nature Systems: Entwicklung von Systemen mit elektronischen und nichtelektronischen Komponenten, Februar 2007, Erfurt  

  1589. Parametric Measurement Unit and Pin Electronics for modular Mixed Signal Test Systems   A. Rolapp, R. Paris Chip, Packaging, Design, Simulation and Test - International Conference, Workshop and Table-top Exhibition 'Semiconductor Conference Dresden 2009' (SCD 2009), 29. - 30. April 2009, Dresden  

  1590. Parametric Measurement Unit und Pinelektronik für ein modulares Mixed Signal Testsystem   A. Rolapp, R. Paris 21. Workshop 'Testmethoden und Zuverlässigkeit von Schaltungen und Systemen' (TuZ 2009), Tagungsband S. 86, 15. - 17. Februar 2009, Bremen