2142 results
Reference
  1561. OPTOELECTRONICS BiCMOS OEIC for optical storage systems  
M. Heise, K. Kieschnick H. Pleß H. Zimmermann Electronics Letters, September 1998  
Reference
  1562. OptoMed vacuum air bearings  
Set-up consisting of metal pipes, cables and measuring devices on a laboratory bench. Air bearings in high-precision vacuum applications? Together with our partners, we are exploring the technical feasibility of this (apparent) contradiction.  
Reference
  1563. OPV und TIA-Optimierung mit WiCkeD  
V. Boos, St. Lange Workshop: 'Effizienzsteigerung und Ausbeuteverbesserung im analogen Schaltungsentwurf mit WiCkeD, 20.01.2004, Erfurt  
About us
  1564. Organisation  
Organigram of IMMS. Photograph: Kvalifik, Unsplash. Organisation: Here you will find our organisation chart, information on the Institute’s management, our departments, our supervisory board and our scientific advisory board, as well as contact details.  
Reference
  1565. Out-of-Band Over-The-Air-Update for LoRaWAN-based Sensor Networks using BLE  
Florian Jung, Silvia Krug Tino Hutschenreuther 2025 IEEE International Workshop on Metrology for Agriculture and Forestry (MetroAgriFor), October 28-30, 2025, Bologna, Italy  
Reference
  1566. Ovutinin  
For an innovative rapid test for fertility diagnostics, IMMS is developing an image sensor for time-resolved fluorescence measurement.  
Reference
  1567. PANDIA  
IMMS develops novel CMOS and SPAD sensor ICs for spectroradiometers for faster and more sensitive analysis of light  
Reference
  1568. Parameter extraction such as layer thickness and stress at wafer level for process monitoring in semiconductor manufacturing  
, Microstructure User Meeting 2026, Symposium on optical vibration measurement, March 19, 2026, Waldbronn, Germany  
Reference
  1569. Parameter Identification of Membrane Structures - Chances and Limitations  
S. Michael, SSI 2010 - MEMUNITY Workshop, 24.03.2010, Grenoble, France  
Reference
  1570. Parameter Identification of MEMS Membrane and Beam Structures by Modal Analysis and Dynamic Measurements  
St. Michael, ANSYS Conference & 27. CADFEM Users' Meeting, 18. - 20. November 2009, Leipzig  
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