“In this partnership, not only are we able to rely on consistently high quality, dependability on delivery dates and flexible responses when customised changes are needed, but we benefit all round because IMMS proactively contributes ideas and suggestions for improvement. We can thus recommend the Institute unreservedly as a provider of testing services to industry.”
,
Jun Tan
Muralikrishna Sathyamurthy
Alexander Rolapp
Jonathan Gamez
Moataz Elkharashi
Benjamin Saft
Sylvo Jäger
Ralf Sommer
in IEEE Journal of Radio Frequency Identification, vol. 4, no. 1, pp. 3-13, March 2020, DOI: https://doi.org/10.1109/JRFID.2020.2967862
Björn Bieske,
Tom Reinhold
Jun Tan
32. GI/GMM/ITG-Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ 2020), 16. - 18. Februar 2020, Ludwigsburg, Germany
Ingo Ortlepp,
Michael Kühnel, Martin Hofmann, Laura Weidenfeller
Johannes Kirchner, Shraddha Supreeti
Rostyslav Mastylo, Mathias Holz
Thomas Michels, Roland Füßl
Ivo W. Rangelow, Thomas Fröhlich
Denis Dontsov
Christoph Schäffel
Eberhard Manske
Proc. SPIE 11324, Novel Patterning Technologies for Semiconductors, MEMS/NEMS and MOEMS 2020, 113240A (23 March 2020), DOI: https://doi.org/10.1117/12.2551044
