1789 results
Reference
1161.
Knowing your A/MS system's Limit: System Acceptance Region Exploration by using Automated Model Refinement and Accelerated Simulation (Kopie 1)
Reference
1163.
Design of a Power Amplifier Module in a Novel Silicon-Ceramic Substrate for an LTE Transmitter
Reference
1164.
Towards Robust Communication-Based Object Monitoring Under Harsh Propagation Conditions
Reference
1167.
INSPECT – Mikroelektronische Diagnostikplattformen für die personalisierte Krebsforschung und Mikro-Bioreaktoren