Identification of Critical Scenarios in AMS Verification: Methodology for Finding the Safe Operating Area of AMS Systems

Georg Gläser¹. Hyun-Sek Lukas Lee². Markus Olbrich². Erich Barke². Eckhard Hennig³.

2016 Design, Automation & Test in Europe (DATE), 14 – 18 March 2016, University Booth, Embedded Tutorial: Analog-/Mixed-Signal Verification Methods for AMS Coverage Analysis, Dresden, Germany

¹IMMS Institut für Mikroelektronik- und Mechatronik-Systeme gemeinnützige GmbH, Ehrenbergstraße 27, 98693 Ilmenau. ²Institute of Microelectronic Systems, Leibniz Universität Hannover, Germany. ³Reutlingen University, Germany.

Integrated sensor systems Talk and poster presentation

Current Publication

Identification of Critical Scenarios in AMS Verification: Methodology for Finding the Safe Operating Area of AMS Systems

Related content

ANCONA

EDA Achievement Award 2018: Für seine Verdienste in der Entwicklung neuer anwendungsorientierte Methoden zur verbesserten Analyse integrierter Mixed-Signal Schaltungen und deren Umsetzung in die industrielle Praxis

Competition Runner-up für den Beitrag: Automated Generation of System-Level AMS Operating Condition Checks: Your Model's Insurance Policy

Best Paper Award für den Beitrag: Knowing Your AMS System’s Limits: System Acceptance Region Exploration by Using Automated Model Refinement and Accelerated Simulation