Jenny Klaus,
Eric Schäfer
Roman Paris
Astrid Frank
Ralf Sommer
In Integration, the VLSI Journal, Volume 58, 2017, Pages 454-462, ISSN 0167-9260, DOI: https://doi.org/10.1016/j.vlsi.2017.03.014
Andreas Fürtig,
Georg Gläser
Christoph Grimm
Lars Hedrich
Stefan Heinen
Hyun-Sek Lukas Lee
Gregor Nitsche
Markus Olbrich
Carna Radojicic
Fabian Speicher
2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Dresden, Germany, 19-21 April 2017, pp. 97-102, DOI: https://doi.org/10.1109/DDECS.2017.7934589
