571. Parameter Identification of Piezoelectric AlGaN/GaN Beam Resonators by Dynamic Measurements   St. Michael, K. Brueckner F. Niebelschuetz K. Tonisch C. Schäffel 10th EuroSimE 2009, 26.-28. April, Delft, Netherlands  

  572. Parameter Identification of MEMS Membrane and Beam Structures by Modal Analysis and Dynamic Measurements   St. Michael, ANSYS Conference & 27. CADFEM Users' Meeting, 18. - 20. November 2009, Leipzig  

  573. Parameter Identification of Membrane Structures - Chances and Limitations   S. Michael, SSI 2010 - MEMUNITY Workshop, 24.03.2010, Grenoble, France  

  574. Parameter extraction such as layer thickness and stress at wafer level for process monitoring in semiconductor manufacturing   Steffen Michael, Microstructure User Meeting 2026, Symposium zur optischen Schwingungsmessung, March 19, 2026, Waldbronn, Germany  

  577. Out-of-Band Over-The-Air-Update for LoRaWAN-based Sensor Networks using BLE   Florian Jung, Silvia Krug Tino Hutschenreuther 2025 IEEE International Workshop on Metrology for Agriculture and Forestry (MetroAgriFor), October 28-30, 2025, Bologna, Italy  

  579. OPV und TIA-Optimierung mit WiCkeD   V. Boos, St. Lange Workshop: 'Effizienzsteigerung und Ausbeuteverbesserung im analogen Schaltungsentwurf mit WiCkeD, 20.01.2004, Erfurt