IMMS - Search

Reference

841. Hitzefest - Design von Mixed-Signal-Hochtemperatur-ICs

St. Richter, W. Göttlich D. Nuernbergk V. Nakov S. Bormann Design & Elektronik, Sonderdruck, S. 56f, März 2002

Reference

842. Hochpräzise positionieren – Integrierter 6-DOF-Direktantrieb bewegt Objekte nanometergenau im Raum

Christoph Schäffel, Konstruktion, Sonderteil Antriebstechnik, https://www.ingenieur.de/fachmedien/konstruktion/antriebstechnik/hochpraezise-positionieren/, 13. Oktober 2020

Reference

843. Hochtemperatur-Wafertest bis 300°C

Marco Reinhard, Ulrich Liebold André Richter Ingo Gryl 28. GMM/GI/ITG Workshop – Testmethoden und Zuverlässigkeit von Schaltungen, TuZ 2016, 06.03.2016 - 08.03.2016, Siegen, Germany

Press release

844. Hohe Qualität der wissenschaftlichen Arbeit am IMMS

We connect the digital to the analog world. Photograph: IMMS.

Reference

845. HoLoDEC

Close-up of a milling machine to which an approximately 2 x 2 cm small wireless circuit board with sensors and an illuminated LED is held.

IMMS researches ultra-low-power architectures (ULP) and circuit concepts as well as energy-efficient edge-AI systems with overall system energy modeling

Reference

846. Hörbarmachung von Ultraschallsignalen

Peter Holstein, Nicki Bader A. Tharandt R. John S. Uziel D. Januszko T. Hutschenreuther Fortschritte der Akustik - DAGA 2016, 42. Jahrestagung für Akustik, 14.-17. März 2016

Reference

847. Hot Fuzz: Assisting verification by fuzz testing microelectronic hardware

Henning Siemen, Jonas Lienke Georg Gläser 2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), Funchal, Portugal, July 03-05, 2023, pp. 1-4, DOI: https://doi.org/10.1109/SMACD58065.2023.10192176

Reference

848. HoTSens

Tests for an ASIC developed by IMMS for extremely precise measurements in very hot environments. Photograph: IMMS.

Integrated sensors and microelectronics operate at 300°C, enabling more efficient processes

Reference

849. HTS Multilayer Technology for Optimal Bit-Error Rate RSFQ Cells

D. Cassel, Th.Ortlepp K.S.Ilin G.Pickartz B.Kuhlmann R.Dittmann H. Töpfer IEEE Trans. Appl. Supercond., 13(2003) 2, S. 409-412

Reference

850. HTS SFQ circuit design

H.Töpfer, Hitachi Central Research Laboratory, 14.11.2002, Tokyo, Japan