1731 results
Reference
  291. SMARTIEHS - The interferometric test station for parallel inspection of MEMS and MOEMS  
K. Gastinger, M. Kujawinska U. Zeitner C. Gorecki Dr. Ch. Schäffel 11th Scientific Conference Optoelectronic and Electronic Sensors COE, 20.06-23.06.2010, Polen  
Reference
  292. SMARTIEHS - a European Project for Parallel Testing of M(O)EMS  
S. Michael, K. Gastinger M. Kujawinska U. Zeitner J. Albero S. Beer R. Moosburger M. Pizzi Smart Systems Integration, 23.03.-24.03.2010, Como, Italy  
Reference
  293. SMARTIEHS  
The newly developed measurement system can simultaneously inspect MEMS structures on wafer level to significantly reduce test effort.  
Reference
  295. Smart Jacket  
A knitted and washable remote control for better daily living  
Reference
  296. Smart Home Platform for the Integration of Image Information in Daily Life Situations  
Tino Hutschenreuther, Marco Götze Wolfram Kattanek 13. SpectroNet Collaboration Forum, Konstanz, 17.04.2012  
Research field
  297. Smart distributed measurement and test systems  
Research field Smart distributed measurement and test systems: Integrated sensor ICs are the heart of sensor and measurement systems like wireless sensors, stationary or handheld devices. We are researching solutions for ever more powerful sensors with more intrinsic intelligence and task allocation in the network.  
Reference
  298. Smart City - Leben & Arbeiten in vernetzten Welten  
Wolfgang Sinn, 8. Silicon Saxony Day, Fachforum 'Smart City', Dresden, 24.06.2013  
Reference
  299. Small-Signal Modeling of a Single-Switch AC/DC Power-Factor-Correction Circuit  
H. Wei, G. Zhu P. Kornetzky I. Bartaseh IEEE Trans. on Power Electronics, Vol. 14, No. 6, November 1999  
Event
  300. SMACD 2025  
A man is sitting in front of a computer with 2 screens with a programming and design environment. International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design  
Search results 291 until 300 of 1731