IMMS - Search

Reference

291. SMARTIEHS - The interferometric test station for parallel inspection of MEMS and MOEMS

K. Gastinger, M. Kujawinska U. Zeitner C. Gorecki Dr. Ch. Schäffel 11th Scientific Conference Optoelectronic and Electronic Sensors COE, 20.06-23.06.2010, Polen

Reference

292. SMARTIEHS - a European Project for Parallel Testing of M(O)EMS

S. Michael, K. Gastinger M. Kujawinska U. Zeitner J. Albero S. Beer R. Moosburger M. Pizzi Smart Systems Integration, 23.03.-24.03.2010, Como, Italy

Reference

293. SMARTIEHS

The developed test system can rapidly inspect about 10,000 structures on such wafers. Photograph: IMMS.

The newly developed measurement system can simultaneously inspect MEMS structures on wafer level to significantly reduce test effort.

Press release

294. Smart Jacket vorgestellt – gestrickte Fernbedienung, waschbar bis 60°C

Minister Wolfgang Tiefensee, TMWWDG, zur Präsentation des Smart Jackets am 13.09.2016 in Ilmenau. Foto: IMMS.

Reference

295. Smart Jacket

Work on a smart jacket with knitted switches and washable, energy-efficient electronics. Photograph: IMMS.

A knitted and washable remote control for better daily living

Reference

296. Smart Home Platform for the Integration of Image Information in Daily Life Situations

Tino Hutschenreuther, Marco Götze Wolfram Kattanek 13. SpectroNet Collaboration Forum, Konstanz, 17.04.2012

Research field

297. Smart distributed measurement and test systems

Smart distributed sensor technology for monitoring microclimate and drought stress in agriculture. Photo: IMMS.

Research field Smart distributed measurement and test systems: Integrated sensor ICs are the heart of sensor and measurement systems like wireless sensors, stationary or handheld devices. We are researching solutions for ever more powerful sensors with more intrinsic intelligence and task allocation in the network.

Reference

298. Smart City - Leben & Arbeiten in vernetzten Welten

Wolfgang Sinn, 8. Silicon Saxony Day, Fachforum 'Smart City', Dresden, 24.06.2013

Reference

299. Small-Signal Modeling of a Single-Switch AC/DC Power-Factor-Correction Circuit

H. Wei, G. Zhu P. Kornetzky I. Bartaseh IEEE Trans. on Power Electronics, Vol. 14, No. 6, November 1999

About us

300. Sites

IMMS headquarters at the Ernst Abbe Centre in Ilmenau. Photograph: IMMS.

Sites: In Ilmenau, we research Magnetic 6D direct drives with nm precision and Smart distributed measurement and test systems. At our Erfurt branch office, we focus on Integrated sensor systems.