2169 results
Reference
  241. Test der Entwurfsmethode für inkrementelle Messsysteme anhand einer Beispielapplikation  
J. Zellmann, IMMS F&E Report, 19.10.1999, Ilmenau  
Service for R&D
  242. Test and characterisation  
[Translate to English:] Service for R&D: Test and characterisation. We test, characterise and qualify your circuits, sensors and systems. Based on our excellent pool of measurement equipment, we develop an individually adapted test environment for measurements on wafers and individual components.  
Reference
  243. TESCA  
The drive system for a terahertz camera allows security checks whereby people can be effectively scanned for hidden objects as they simply pass by.  
Reference
  244. Terminalsystem 2.0: Neue, flexible Möglichkeiten der Kombination von PXI-Testerressourcen bis 1 GHz  
Björn Bieske, Ludwig Kircher Alexander Rolapp 33. GI/GMM/ITG-Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ 2021), 22. Februar 2021, online  
Reference
  245. Temporal Decoupling with Error-Bounded Predictive Quantum Control  
Georg Gläser, Gregor Nitsche Eckhard Hennig Languages, Design Methods and Tools for Electronic System Design, Selected Contributions from FDL 2015, ISBN 978-3-319-31722-9, pages 125-150  
Reference
  246. Temporal Decoupling with Error-Bounded Predictive Quantum Control  
Georg Gläser, Gregor Nitsche Eckhard Hennig Specification and Design Languages (FDL), 2015 Forum on, 14-16 Sept. 2015, Barcelona, Spain, (Best-Paper-Award), DOI: http://dx.doi.org/10.1109/FDL.2015.7306358, Print ISBN - IEEE Xplore 978-1-4673-7735-5  
Reference
  247. Temperaturfeldberechnungen in der Mikromechanik  
K. Rettig, 16. CAD-FEM User Meeting, Bad Neuenahr-Ahrweiler, Oktober 1998  
Event
  248. TELFOR 2019  
27th Telecommunications Forum TELFOR 2019  
Event
  249. TELFOR 2017  
25th Telecommunications Forum TELFOR 2017  
Event
  250. TELFOR 2015  
Lecture at the ”23rd Telecommunications Forum“  
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