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Reference
  242. Test mit Zukunft - Smart PXI  
 
Service for R&D
  245. Test and characterisation  
[Translate to English:] Service for R&D: Test and characterisation. We test, characterise and qualify your circuits, sensors and systems. Based on our excellent pool of measurement equipment, we develop an individually adapted test environment for measurements on wafers and individual components.  
Reference
  246. TESCA  
The drive system for a terahertz camera allows security checks whereby people can be effectively scanned for hidden objects as they simply pass by.  
Reference
  247. Terminalsystem 2.0: Neue, flexible Möglichkeiten der Kombination von PXI-Testerressourcen bis 1 GHz  
Björn Bieske, Ludwig Kircher, Alexander Rolapp, online 2021 33. GI/GMM/ITG-Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ 2021)  
Reference
  248. Temporal Decoupling with Error-Bounded Predictive Quantum Control  
Georg Gläser, Gregor Nitsche, Eckhard Hennig, 2016 Languages, Design Methods and Tools for Electronic System Design, Selected Contributions from FDL 2015  
Reference
  249. Temporal Decoupling with Error-Bounded Predictive Quantum Control  
Georg Gläser, Gregor Nitsche, Eckhard Hennig, Barcelona, Spain 2015 2015 Forum on Specification and Design Languages (FDL)  
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