1768 results
Press release
  1761. "Jugend forscht"-Sieger im IMMS  
 
Reference
  1762. Systematic comparison of basic structures for electromagnetic energy harvesters using an automated design methodology  
Bianca Leistritz, Wolfram Kattanek 18th International Conference on Micro and Nanotechnology for Power Generation and Energy Conversion Applications, PowerMEMS 2018, 4-7 December, 2018, Daytona Beach, Florida, USA  
Reference
  1763. Propagation Delay Estimation for Mixed-Signal Modeling of Comparators  
Martin Grabmann, Eric Schäfer Georg Gläser 2024 20th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), Volos, Greece, July 02-05, 2024, pp. 1-4, DOI: https://doi.org/10.1109/SMACD61181.2024.10745467  
Reference
  1764. Positionierungssystem zur dreidimensionalen Positionierung eines Objektes sowie Verfahren zu seinem Betrieb  
Steffen Hesse, Christoph Schäffel Michael Katzschmann Bianca Leistritz Stephan Gorges Jorge Amado Gonzalez Whittinham DE 10 2021 103 220 A1  
Reference
  1765. Machine Learning in Charge: Automated Behavioral Modeling of Charge Pump Circuits  
Martin Grabmann, Christian Landrock Georg Gläser 2021 17th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), Proceedings in: 423 Seiten, 140 x 124 mm, Slimlinebox, CD-Rom, ISBN 978-3-8007-5588-2, E-Book: ISBN 978-3-8007-5589-9, https://ieeexplore.ieee.org/document/9547918, 19 - 22 July 2021, Erfurt, Germany, online  
Reference
  1766. Impact of Input Data on Intelligence Partitioning Decisions for IoT Smart Camera Nodes  
Isaac Sánchez Leal, Irida Shallari Silvia Krug Axel Jantsch Mattias O’Nils Electronics 2021, 10, 1898. DOI: https://doi.org/10.3390/electronics10161898  
Reference
  1767. Energieautarkes Industrie-4.0-konformes Funksensorsystem  
Wolfram Kattanek, Science meets Industry, 23. Januar 2019, Chemnitz  
Reference
  1768. A modular application specific active test environment for high-temperature wafertest up to 300 °C  
Michael Meister, Marco Reimard International Conference and Exhibition on High Temperature Electronics Network (HiTEN 2019), 8 - 10 July 2019, St. Anne’s College in the University of Oxford, Oxford, United Kingdom, DOI: https://doi.org/10.4071/2380-4491.2019.HiTen.000122  
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