1701. Characterizing Dynamics of MEMS Devices on Wafer Level Using Optical Measurement Techniques   Sebastian Giessmann, Steffen Michael Eric Lawrence Dr. Heinrich Steger Commercial Micro Manufacturing International Magazine (CMM Magazine), 08-2023, VOL 16 NO. 3, pp. 30-39  

  1703. Challenges of Building AI-Based Virtual Temperature Sensors for Nanopositioning Systems (NPS)   Amin Suaad, Silvia Krug Tino Hutschenreuther IEEE AI4IM 2026, IEEE Symposium on Artificial Intelligence for Instrumentation and Measurement, Mai 21-23, 2026, Amalfi, Italy  

  1704. Challenges in Analog/Mixed-Signal EDA   R. Sommer, MunEDA User Group Meeting Europe 2007, 25.-26. September 2007, München  

  1705. Challenges and Applications of Mobile Wireless ad-hoc Sensor Networks for Environmental Monitoring   J. Bumberger, H. Mollenhauer P. Remmler O. Mollenhauer T. Hutschenreuther H.Toepfer P. Dietrich Workshop am Helmholtz-Zentrum für Umweltforschung – UFZ, Kommissionssitzung der Kommission I, Bodenphysik und Bodenhydrologie, 11.09.2014-12.09.2014, Leipzig