1732 results
Reference
151.
Robust Adaptive Tracking Control of a 3D Vertical Motion System for Nanometer Precision Applications
Reference
155.
Characterizing Dynamics of MEMS Devices on Wafer Level Using Optical Measurement Techniques
Press release
156.
Reliable and faster chip designs through invasive and parametric simulation methods
Reference
158.
LO and Calibration Signal Distribution in a Multi-Antenna Satellite Navigation Receiver