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Press release

1571. Development of an inline cleaning system for washing media in resin-based 3D printing production

Kick-off meeting on 11 September 2025 in Erfurt for the project "Inline cleaning process for washing media in resin-based 3D printing processes" (Inline3D), which was launched in June 2025. Photograph: IMMS.

Inline3D project launched to minimise pollutants and costs in 3D printing

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1572. Development of a vertical wafer stage for high vacuum applications

E. Beckert, 15th Annual Meeting American Society of Precision Engineers (ASPE), Scottsdale, Arizona, USA, Oktober 2000

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1573. Development of a digital SQUID magnetometer for widely varying fields in urban environment

T. Reich, Oktober 2009, Technische Universität Ilmenau

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1574. Development of a bandwidth measurement for photo diodes

M. Meister, X-FAB Workshop 'Process Development & Characterisation Workshop on Innovation', 15.-16.11.2006, Luisenthal

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1575. Development and validation of a simplified coil model for CFD simulation of a nano-positioning planar drive system

Ina Naujokat, Ludwig Herzog Steffen Hesse Parastoo Salimitari Euspen Special Interest Conference: Precision & Performance 2025, Proceedings: https://www.euspen.eu/euspen-knowledge-base/proceedings-search/#!/event=9944, November 18-20, 2025, Cranfield University, United Kingdom

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1576. Development of a vertical wafer stage for high vakuum applications

E. Beckert, A. Hoffmann E. Saffert Micro- and Nano-Engineering 2000, September 2000

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1577. Developing and Testing RF modules in CMOS for ISM Bands using PXI platform

Björn Bieske, Klaus Heinrich Transactions on Systems, Signal & Devices (TSSD), Vol. 8, No. 4, pp. 1-13

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1578. Developing and Testing RF modules in CMOS for ISM and SRD Bands using PXI platform

B. Bieske, K.Heinrich 9th International Multi-Conference on Systems, Signals and Devices (SSD), 2012, Chemnitz, 20.03.2012-23.3.2012

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1579. Developing and Testing RF modules in CMOS for ISM and SRD Bands using PXI platform

B. Bieske, K.Heinrich 9th International Multi-Conference on Systems, Signals and Devices (SSD), 2012, Digital Object Identifier: 10.1109/SSD.2012.6197945, http://ieeexplore.ieee.org, IEEE Xplore Digital Library, E-ISBN 978-1-4673-1589-0

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1580. Determination of yaw angle of mirror origin in a 6-DOF nanopositioning stage

Davi Anders Brasil, Michael Katzschmann Steffen Hesse Ludwig Herzog Thomas Kissinger Thomas Fröhlich International Scientific Symposium on World Interferometry Day 2026, 20. April 2026, Ilmenau, Germany