1481. Analog EDA Using Knowledge-Based Methods   Ralf Sommer, Jürgen Scheible Benjamin Prautsch Lorenz Renner Till Moldenhauer Yannick Uhlmann edaWorkshop 2024 and the European Nanoelectronics Applications, Design & Technology Conference (ADTC), 9. - 10. April 2024, Dresden, Germany  

  1482. An Ultra-Low Power Capacitance Extrema and Ratio Detector for Electrostatic Energy Harvesters   Benjamin Saft, Eric Schäfer Alexander Rolapp Eckhard Hennig 41th European Solid-State Circuits Conference ESSCIRC, 14-18 Sept. 2015, Pages 245 - 248, DOI: http://dx.doi.org/10.1109/ESSCIRC.2015.7313873, ISBN: 978-1-4673-7470-5, Graz, Austria  

  1483. An RFID to I2C Bridge IC with Supply Interference Reduction for Flexible RFID Sensor Applications   Jun Tan, Muralikrishna Sathyamurthy Alexander Rolapp Jonathan Gamez Moataz Elkharashi Benjamin Saft Sylvo Jäger Ralf Sommer 2019 IEEE International Conference on RFID (RFID), Phoenix, AZ, USA, 2019, 2-4 April 2019, pp. 1-6, DOI: https://doi.org/10.1109/RFID.2019.8719257  

  1484. An Open Platform for Distributed Urban Noise Monitoring   Marco Goetze, Rolf Peukert Tino Hutschenreuther Hannes Toepfer 2017 25th Telecommunication Forum (TELFOR), 21-22 November 2017, Belgrade, Serbia, pp. 1-4, DOI: https://doi.org/10.1109/TELFOR.2017.8249339  

  1485. An IoT-based Sensor System to Capture Flower Bud Growth in Spring   Silvia Krug, Tino Hutschenreuther 19. GI/ITG KuVS Fachgespräch Sensornetze (FGSN 2022), pp. 37-40, DOI: https://doi.org/10.34702/mncp-qb18. 15. September 2022, Berlin, Germany  

  1486. An interferometric test station for massive parallel inspection of passive and active M(O)EMS   M. Kujawinska, K. Gastinger M. Jozwik K. Haugholt C. Schäffel S. Beer 3rd Topical Meeting on Optical Microsystems, 27-30.09.2009, Capri  

  1487. An interferometric test station for massive parallel inspection of MEMS and MOEMS   M. Kujawinska, K. Gastinger M. Jozwik K. Haugholt C. Schäffel S. Beer PHOTONICS LETTERS OF POLAND, VOL. 1 (2), (2009)  

  1488. An Integrated FSK Demodulator with Built-In Self-Calibration   P. Teichmann, Analog 06, 27. - 29.09.2006, Dresden  

  1489. An Integrated CMOS Photodiode Array for Highly Sensitive Photometric Diagnostics   Alexander Hofmann, Michael Meister Susette Germer Friedrich Scholz 2018 15th International Multi-Conference on Systems, Signals & Devices (SSD), Yassmine Hammamet, Tunisia, 19-22 March 2018, pp. 1465-1470. DOI: https://doi.org/10.1109/SSD.2018.8570541  

  1490. An Improved Low-Power CMOS Thyristor-Based Micro-to-Millisecond Delay Element   Benjamin Saft, Eric Schäfer André Jäger Alexander Rolapp Eckhard Hennig European Solid State Circuits Conference (ESSCIRC), ESSCIRC 2014 - 40th, Pages 123 – 126, DOI: http://dx.doi.org/10.1109/ESSCIRC.2014.6942037