D. Kirsten,
D. Nuernbergk
S. Richter
St. Richter
Fachzeitschrift 'Solid-State Electronics' Nr. 49 (2005) page 1484-1487, Veröffentlichung, November 2005
Core topic Embedded AI in our Smart distributed measurement and test systems research field: The numerous existing AI algorithms and methods for high-performance computing are unsuitable for embedded systems. We are researching to optimise AI algorithms and methods so that they can be used on embedded systems.