IMMS - Search

Reference

121. Übersicht zur Simulation von Multi-Nature -Systeme

K.Coddens, R.Diels D. Nuernbergk F. Rößler R. Syba MTT 2000, 3. Fachausstellung und Technologiesymposium, Erfurt, Mai 2000

Reference

122. Übersicht zum Stand des HF-Entwurfs

M. Lange, IMMS, F & E Report 1/98, Ilmenau, Januar 1998

Reference

123. Two-dimensional electron gas based actuation of piezoelectric AlGaN/GaN microelectromechanical resonators

K. Brueckner, F. Niebelschuetz K. Tonisch St. Michael A. Dadgar A. Krost V. Cimalla O. Ambacher R. Stephan M.A. Hein APPLIED PHYSICS - LETTERS 93, 173504 _2008

Reference

124. TÜV SÜD Innovation Award 2019: 3rd place for the SONAPHONE digital mobile ultrasonic detector for maintenance 4.0.

For their joint SONAPHONE development, SONOTEC and IMMS received the 2019 TÜV Süd Innovation Award, rank 3. Photograph: IMMS.

Reference

125. TSN test lab

In the TSN laboratory IMMS investigates technological limits in the development of data-intensive industrial real-time applications. Photograph: IMMS.

In the Time Sensitive Networking (TSN) laboratory, IMMS is exploring the technological limits to the creation of data-intensive industrial real-time applications.

Reference

126. TSN – ein neuer Vernetzungsstandard für Industrie 4.0

Thomas Elste, Ralf Sommer edaWorkshop 2018, 16.-17. Mai 2018, Hannover

Reference

127. Trust is good, monitoring is better: An FPGA/TEE-Based Monitoring-Approach to Malware Detection and Prevention

Friederike Bruns, Georg Gläser Florian Kögler Jonas Lienke Nithin Ravani Nanjundaswamy Gregor Nitsche Behnam Razi Perjikolaei Jörg Walter edaWorkshop 2024 and the European Nanoelectronics Applications, Design & Technology Conference (ADTC), 9. - 10. April 2024, Dresden, Germany

Reference

128. Trib.US

IMMS developed the real-time capable platform and AI algorithms for the Trib.US mobile multi-sensor testing device. Photograph: IMMS.

Real-time capable platform and algorithms for mobile multi-sensor inspection device for the maintenance of roller bearings

Reference

129. Tri-Gate Al0.2Ga0.8N/AlN/GaN HEMTs on SiC/Si-substrates

Wael Jatal, Uwe Baumann Heiko O. Jacobs Frank Schwierz Jörg Pezoldt Materials Science Forum, ISSN: 1662-9752, Vol. 858, pp 1174-1177, DOI: http://www.scientific.net/MSF.858.1174, ©2016 Trans Tech Publications, Switzerland

Reference

130. Trends in der Sensortechnologie - Einsatz der Sensorik für die Qualitätssicherung

Wolfgang Sinn, Treffen des Regionalkreises Erfurt der Deutschen Gesellschaft für Qualität (DGQ), Ilmenau, 06.07.2012