IMMS - Search

About us

1241. Organisation

Organigram of IMMS. Photograph: Kvalifik, Unsplash.

Organisation: Here you will find our organisation chart, information on the Institute’s management, our departments, our supervisory board and our scientific advisory board, as well as contact details.

Reference

1242. Ovutinin

Mit einem neuen Ovulationsschnelltest soll die fruchtbare Phase bis zu 6 Tage vor dem Eisprung bestimmt werden. Image by Serhii Kuch from Pixabay.

For an innovative rapid test for fertility diagnostics, IMMS is developing an image sensor for time-resolved fluorescence measurement.

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1243. Parameter Identification of Membrane Structures - Chances and Limitations

S. Michael, SSI 2010 - MEMUNITY Workshop, 24.03.2010, Grenoble, France

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1244. Parameter Identification of MEMS Membrane and Beam Structures by Modal Analysis and Dynamic Measurements

St. Michael, ANSYS Conference & 27. CADFEM Users' Meeting, 18. - 20. November 2009, Leipzig

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1245. Parameter Identification of Piezoelectric AlGaN/GaN Beam Resonators by Dynamic Measurements

St. Michael, K. Brueckner F. Niebelschuetz K. Tonisch C. Schäffel 10th EuroSimE 2009, 26.-28. April, Delft, Netherlands

Reference

1246. Parameteridentifikation von MEMS auf Wafer-Level mittels dynamischer Messungen

S. Michael, R. Paris S. Hering 6. ITG/GI/GMM-Workshop Multi-Nature Systems: Entwicklung von Systemen mit elektronischen und nichtelektronischen Komponenten, Februar 2007, Erfurt

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1247. Parametric Measurement Unit and Pin Electronics for modular Mixed Signal Test Systems

A. Rolapp, R. Paris Chip, Packaging, Design, Simulation and Test - International Conference, Workshop and Table-top Exhibition 'Semiconductor Conference Dresden 2009' (SCD 2009), 29. - 30. April 2009, Dresden

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1248. Parametric Measurement Unit und Pinelektronik für ein modulares Mixed Signal Testsystem

A. Rolapp, R. Paris 21. Workshop 'Testmethoden und Zuverlässigkeit von Schaltungen und Systemen' (TuZ 2009), Tagungsband S. 86, 15. - 17. Februar 2009, Bremen

Reference

1249. Parasitic Symmetry at a Glance: Uncovering Mixed-Signal Layout Constraints

Georg Gläser, Benjamin Saft Ralf Sommer FAC 2017, Frontiers in Analog CAD, Frankfurt on the Main, Germany, 21-22 July 2017, pp. 1-6. URL: http://ieeexplore.ieee.org/document/8011279/

About us

1250. Partners

Many partners from R&D projects also use our services and some we involve as innovative, certified manufacturing partners to cover the value chain up to series production. Photo (reticle for semiconductor manufacturing): X-FAB.

Partners: We involve innovative, certified manufacturing partners to cover the value chain in R&D projects. You will also find an overview of our project partners from science and industry and information on how you can become a partner.