1731 results
Reference
  1241. Optimization of Analog Circuits with Automatic Device Type Selection  
B. Dimov, V. Boos T. Reich C. Lang E. Hennig R. Sommer Xth International Workshop on Symbolic and Numerical Methods, Modeling and Applications to Circuit Design (SM²ACD'08), 7.-8. Oktober 2008, Erfurt, Germany  
Reference
  1242. Optimizing the IoT Performance: A Case Study on Pruning a Distributed CNN  
Eiraj Saqib, Isaac Sánchez Leal Irida Shallari Axel Jantsch Silvia Krug Mattias O'Nils 2023 IEEE Sensors Applications Symposium (SAS), 18-20 July 2023, Ottawa, ON, Canada, July 18-20, 2023, pp. 1-6, DOI: https://doi.org/10.1109/SAS58821.2023.10254054.  
Reference
  1243. Optische Kommunikation nach IEEE 1394b über POF  
H.Töpfer, 09.03.2004, 18. Fachgruppentreffen ITG-FG 5.4.1. Optische Polymerfasern, Erfurt  
Reference
  1244. Optischer Sensor und Verstärker in BiCMOS  
M. Heise, H. Pleß Design & Elektronik, September 1998  
Reference
  1245. OPTOELECTRONICS BiCMOS OEIC for optical storage systems  
M. Heise, K. Kieschnick H. Pleß H. Zimmermann Electronics Letters, September 1998  
Reference
  1246. OPV und TIA-Optimierung mit WiCkeD  
V. Boos, St. Lange Workshop: 'Effizienzsteigerung und Ausbeuteverbesserung im analogen Schaltungsentwurf mit WiCkeD, 20.01.2004, Erfurt  
About us
  1247. Organisation  
Organigram of IMMS. Photograph: Kvalifik, Unsplash. Organisation: Here you will find our organisation chart, information on the Institute’s management, our departments, our supervisory board and our scientific advisory board, as well as contact details.  
Reference
  1248. Ovutinin  
For an innovative rapid test for fertility diagnostics, IMMS is developing an image sensor for time-resolved fluorescence measurement.  
Reference
  1249. Parameter Identification of Membrane Structures - Chances and Limitations  
S. Michael, SSI 2010 - MEMUNITY Workshop, 24.03.2010, Grenoble, France  
Reference
  1250. Parameter Identification of MEMS Membrane and Beam Structures by Modal Analysis and Dynamic Measurements  
St. Michael, ANSYS Conference & 27. CADFEM Users' Meeting, 18. - 20. November 2009, Leipzig  
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