IMMS - Search

Reference

1061. Mag6D

Maglev direct drive with cable-free passive stage. Photograph: IMMS.

Within the project a novel planar drive system was developed which is magnetically guided and moves objects with nanometer precision.

Reference

1062. SMARTIEHS

The developed test system can rapidly inspect about 10,000 structures on such wafers. Photograph: IMMS.

The newly developed measurement system can simultaneously inspect MEMS structures on wafer level to significantly reduce test effort.

Reference

1063. RFID und NFC - Bindeglieder synchronisierter Welten

W. Sinn, Dresden: 5. Dresdner RFID-Symposium, 09.12.2011

Reference

1064. Frequency compensation for a class of DAE's arising in electrical circuits

E. Hennig, D. Krauße E. Schäfer R. Sommer C. Trunk H. Winkler PAMM (Proc. Appl. Math. Mech.). S. 837-838

Reference

1065. Entworfen und bewegt

C. Schäffel, M. Katzschmann 11.2011. Der Konstrukteur S. 22-23

Reference

1066. SyEnA - Syntheseunterstützter Entwurf analoger Schaltungen

A. Graupner, R. Jancke P. Jores J. Nowak R. Popp Newsletter edacentrum. S. 5-16

Reference

1067. Interferometric controlled planar nanopositioning system with 100mm circular travel range

S. Hesse, C. Schäffel M. Katzschmann H.-J. Büchner Denver, USA: ASPE 26th Annual Meeting of the American Society for Precision Engineering. in Proceedings, CD-ROM

Reference

1068. Ein Tool-Framework zur Technologiemigration analoger Schaltungen

V. Boos, J. Nowak Erlangen: Analog 2011

Reference

1069. Ein Tool-Framework zur Technologiemigration analoger Schaltungen

V. Boos, J. Nowak Erlangen: in Proceedings ANALOG 2011. GMM-Fachbericht Band 70. CD-ROM. ISBN 978-3-8007-3369-9

Reference

1070. Interferometric Test Station for Parallel Inspection of MEMS

C. Schäffel, S. Michael R. Paris A. Frank N. Zeike K. Gastinger M. Kujawinska U. Zeitner S. Beer. Dresden: 5. Tagung 'Feinwerktechnische Konstruktion'. 03.11.2011