Current Publication
Next generation test equipment for micro-production
		
		   K. Gastinger1.                     
		  
		
			M. Kujawinska2. 
                  
		
			U. Zeitner3. 
                  
		
			C. Gorecki4.    
                  
		
			Dr. Ch. Schäffel5.   
                  
		
			S. Beer6. 
                 
		
			R. Moosburger7.     
                  
		
			M. Pizzi8. 
                  
		
		
		
Photonics Europe 2010, 12.04-16.04.2010, Brüssel, Belgien
1SINTEF IKT Optical measurement systems and data analysis, Trondheim, Norway.
			
			
				2Warsaw Universtiy of Technology, IMiF, Warsaw, Poland.
			  
			
				3Fraunhofer IOF, Jena, Germany.
			
			
				4CNRS FEMTO-ST, Besançon, France.
			
			
				5IMMS Institut für Mikroelektronik- und Mechatronik-Systeme gemeinnützige GmbH, Ilmenau.
			
			
				6CSEM SA, Zurich, Switzerland.
			
			
				7Heliotis, Root Längenbold, Switzerland.
			
			
				8Techfab s.r.l., Chivasso, Torino, Italy.
			
			
			
		
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