231. A method for dynamic interferometric characterization of air bearings for nanopositioning stages   Steffen Hesse, Michael Katzschmann Alex Huaman Parastoo Salimitari Ludwig Herzog Internationales Wissenschaftliches Symposium zum Welttag der Interferometrie, April 8-9, 2025, Technische Universität Ilmenau, Ilmenau  

  232. A methodology for high-level design of machine vision systems using SystemC   F. Czerner, J. Zellmann Synopsis User Group Meeting (SNUG), 4.- 8. March 2002, Paris  

  233. A modular application specific active test environment for high-temperature wafertest up to 300 °C   Michael Meister, Marco Reinhard International Conference and Exhibition on High Temperature Electronics Network (HiTEN 2019), 8 - 10 July 2019, St. Anne’s College in the University of Oxford, Oxford, United Kingdom, DOI: https://doi.org/10.4071/2380-4491.2019.HiTen.000122  

  234. A Modular Platform to Build Task Specific IoT Network Solutions for Agriculture and Forestry   Silvia Krug, Marco Goetze Sören Schneider Tino Hutschenreuther 2023 IEEE International Workshop on Metrology for Agriculture and Forestry (MetroAgriFor), November 06-08, 2023, Pisa, Italy, pp. 820-825, DOI: https://doi.org/10.1109/MetroAgriFor58484.2023.10424104  

  235. A New Low Voltage Bandgap Reference Topology   M. Isikhan, T. Reich A. Richter E. Hennig International Conference on Electronics Circuits and Systems, 13.-16. Dezember, 2009, Hammamet, Tunesien  

  236. A new tool for industrial tribology - Filling the gap between macro- and nano-tribology   S. Achanta, D. Drees J.-P. Celis O. Mollenhauer F. Spiller 14th International Colloquium 'Tribology and Lubrication Engineering', Esslingen, January 13-15 2004  

  237. A new XY linear stage for Nano technology - The stage can draw 3 diameter true circle   F. Spiller, O. Mollenhauer Tokyo/Japan, Advanced Photonics Technology Exhibition, November 2003  

  238. A novel low leakage EEPROM cell for application in an extended temperature range (-40°C up to 225°C)   S. Richter, D. Kirsten D. Nuernbergk S. Richter A novel low leakage EEPROM cell for application in an extended temperature range (-40°C up to 225°C), D. Flandre et al. (eds.), Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Enviroment, pa: 285-290, Kluwer Academic Publishers, Januar 2005  

  239. A novel low leakage EEPROM cell for application in an extended temperature range (-40°C up to 225°C)   D. Kirsten, D. Nuernbergk S. Richter St. Richter Workshop 'SOI NATO Advanced Research', 25-30.04.2004, Kiev, Ukraine  

  240. A Novel Low-Voltage Bandgap Reference Topology   M. Isikhan, 21. Mikroelektronik-Seminar, 16.04.2009, Erfurt