IMMS - Suche

Referenz

951. Investigations on the positioning accuracy of the Nano Fabrication Machine (NFM-100)

Jaqueline Stauffenberg, Ingo Ortlepp, Ulrike Blumröder, Denis Dontsov, Christoph Schäffel, Mathias Holz, Ivo W. Rangelow, Eberhard Manske, 2021 tm - Technisches Messen

Referenz

952. Investigations of metal systems in a silicon ceramic composite substrate for electrical and thermal contacts as well as associated mounting aspects

Michael Fischer, T. Welker, Bianca Leistritz, Christoph Schäffel, Martin Hoffmann, Jens Müller, Denver, Colorado, USA 2016 Ceramic Interconnect and Ceramic Microsystems Technologies, Additional Conferences (Device Packaging, HiTEC, HiTEN, & CICMT)

Referenz

953. Investigation of thermal and non-linear effects on the performance of the power amplifier - BAW filter - chain in a LTE transmitter

Uwe Stehr, Johannes Stegner, Vikrant Chauhan, Victor Silva Cortes, Robert Weigel, Amelie Hagelauer, Astrid Frank, Steffen Michael, Matthias A. Hein, Kobe, Japan 2018 2018 IEEE International Ultrasonics Symposium, IUS 2018

Referenz

954. Investigation of long-term distance measurement repeatability in a large-range nanopositioning machine combined with a laser focus sensor

Davi Anders Brasil, Michael Katzschmann, Steffen Hesse, Ludwig Herzog, Eberhard Manske, Thomas Fröhlich, Thomas Kissinger, 2026 Meas. Sci. Technol.

Referenz

955. Investigation of distance measurement reproducibility for a long-range nanopositioning machine combined with a laser focus sensor

Davi Anders Brasil, Steffen Hesse, Michael Katzschmann, Ludwig Herzog, Thomas Fröhlich, Thomas Kissinger, Sendai, Japan 2024 20th International Conference on Precision Engineering (ICPE2024)

Referenz

956. Investigation of detectors for optical pick-up systems for DVD applications

Pressemitteilungen

957. Internationale Konferenzen zu Methoden für den Entwurf integrierter Schaltungen

Die in Erfurt geplanten Konferenzen SMACD & PRIME 2021 finden vom 19.–22. Juli virtuell statt. Foto Krämerbrücke Erfurt: lapping @ Pixabay.

Wissenschaftlicher Nachwuchs aus der Elektrotechnik besucht Erfurt virtuell

Referenz

958. Interferometrically controlled, scalable x-y planar positioning stage concept

Ilko Rahneberg, Enrico Langlotz, Denis Dontsov, Steffen Hesse, Jaqueline Stauffenberg, Eberhard Manske, Virtual 2021 Special Interest Group Meeting: Micro/Nano Manufacturing

Referenz

959. Interferometric Test Station for Parallel Inspection of MEMS

Referenz

960. Interferometric Test Station for Parallel Inspection of MEMS