561. Passive 350 GHz Video Imaging Systems for Security Apllications   E. Heinz, T. May D. Born G. Zieger S. Anders V. Zakosarenko H.-G. Meyer C. Schäffel Journal of Infrared, Millimeter and Terahertz Waves manuscript No., DOI: http://dx.doi.org/10.1007/s10762-015-0170-8, Online ISSN: 1866-6906, Print ISSN: 1866-6892, Volume 36, Number 7, July 2015  

  563. Parasitic Symmetry at a Glance: Uncovering Mixed-Signal Layout Constraints   Georg Gläser, Benjamin Saft Ralf Sommer FAC 2017, Frontiers in Analog CAD, Frankfurt on the Main, Germany, 21-22 July 2017, pp. 1-6. URL: http://ieeexplore.ieee.org/document/8011279/  

  564. Parametric Measurement Unit und Pinelektronik für ein modulares Mixed Signal Testsystem   A. Rolapp, R. Paris 21. Workshop 'Testmethoden und Zuverlässigkeit von Schaltungen und Systemen' (TuZ 2009), Tagungsband S. 86, 15. - 17. Februar 2009, Bremen  

  565. Parametric Measurement Unit and Pin Electronics for modular Mixed Signal Test Systems   A. Rolapp, R. Paris Chip, Packaging, Design, Simulation and Test - International Conference, Workshop and Table-top Exhibition 'Semiconductor Conference Dresden 2009' (SCD 2009), 29. - 30. April 2009, Dresden  

  566. Parameteridentifikation von MEMS auf Wafer-Level mittels dynamischer Messungen   S. Michael, R. Paris S. Hering 6. ITG/GI/GMM-Workshop Multi-Nature Systems: Entwicklung von Systemen mit elektronischen und nichtelektronischen Komponenten, Februar 2007, Erfurt  

  567. Parameter Identification of Piezoelectric AlGaN/GaN Beam Resonators by Dynamic Measurements   St. Michael, K. Brueckner F. Niebelschuetz K. Tonisch C. Schäffel 10th EuroSimE 2009, 26.-28. April, Delft, Netherlands  

  568. Parameter Identification of MEMS Membrane and Beam Structures by Modal Analysis and Dynamic Measurements   St. Michael, ANSYS Conference & 27. CADFEM Users' Meeting, 18. - 20. November 2009, Leipzig  

  569. Parameter Identification of Membrane Structures - Chances and Limitations   S. Michael, SSI 2010 - MEMUNITY Workshop, 24.03.2010, Grenoble, France