1621. Enhancing Apple Cultivar Classification Using Multiview Images   Silvia Krug, Tino Hutschenreuther J. Imaging 2024, 10, 94. DOI: https://doi.org/10.3390/jimaging10040094  

  1622. Integration of Chemiluminescence-based SPARCL ® Assay on Microfluidic Platform with SPAD-based CMOS Line Sensor IC for Rapid Cytokine Detection   Benjamin Saft, Biljana Gjurova Pia Scholz Ana Leonor Heitor Lopes Alexander Zimmer Mirjam Skadell Susann Allelein Eric Schäfer POCT Meeting 2024, 17. - 18. April 2024, Leipzig  

  1624. Investigations on tip-based large area nanofabrication and nanometrology using a planar nanopositioning machine (NFM-100)   Jaqueline Stauffenberg, Johannes Belkner Denis Dontsov Ludwig Herzog Steffen Hesse Ivo W Rangelow Ingo Ortlepp Thomas Kissinger Eberhard Manske 2024 Meas. Sci. Technol. 35 085011, DOI: https://doi.org/10.1088/1361-6501/ad4668  

  1625. Effect of spent mushroom compost mulch and irrigation treatment on growth, yield and fruit quality of sweet cherry in a summer-dry climate   Martin Penzel, Claudia Kuhaupt Maria Bamberg Silvia Krug European Horticulture Congress EHC, Symposia „Fruit Production Systems for Sustainable and Resilient Development“, Bucharest, Romania, May 12-16, 2024  

  1626. TEEMSC – Trainable Energy Efficient Machine Diagnosis using Singular Values and Canonical Crosscorrelation   Rick Pandey, Sebastian Uziel Tino Hutschenreuther Silvia Krug IEEE International Workshop on Metrology for Industry 4.0 and IoT, Florence, Italy, May 29-31, 2024, DOI: https://doi.org/10.1109/MetroInd4.0IoT61288.2024.10584173  

  1627. A Charge Pump System with Controlled Input Impedance for Optimized RFID Energy Harvesting   Rohit Kesharwani, Andre Jäger Martin Grabmann David Schreiber Georg Gläser Hani Abdullah Eric Schäfer 2024 IEEE International Conference on RFID (RFID), Boston, MA, USA, June 4-6, 2024, DOI: https://doi.org/10.1109/RFID62091.2024.10582749  

  1628. VE-ARiS: Elektronischer Knowhow-Schutz für innovative Sensorsysteme. Abwehr von Reserve-Engineering auf IC-Ebene   Projektkonsortium VE-ARiS (iC-Haus GmbH, Wachendorff Automation GmbH & Co. KG, IMMS GmbH), Tage der vertrauenswürdigen Elektronik 2024, 4. - 5. Juni 2024, München  

  1629. VE-ARiS: Alberich und die Tarnkappenfabrik. SKAW – Schaltungskopierbarkeitsanalysewerkzeug   Adrian Pitterling, Florian Kögler Georg Gläser Tage der vertrauenswürdigen Elektronik 2024, 4. - 5. Juni 2024, München  

  1630. What The Fuzz (WTF): A Framework for Fuzz Testing ASIC Designs   Henning Siemen, Georg Gläser Tage der vertrauenswürdigen Elektronik 2024, 4. - 5. Juni 2024, München