2115 Ergebnisse
Referenz
  1551. Development of an Integrated Guiding and Actuation Element for High Dynamic Nanopositioning Systems  
Stephan Gorges, Bianca Leistritz Steffen Hesse I. Ortlepp G. Slotta Christoph Schäffel Ilmenau Scientific Colloquium 2017, Session 1.1 – Precision Measurement Technology, 11-15 September 2017, Ilmenau  
Referenz
  1552. Development of a vertical wafer stage for high vacuum applications  
E. Beckert, 15th Annual Meeting American Society of Precision Engineers (ASPE), Scottsdale, Arizona, USA, Oktober 2000  
Referenz
  1553. Development of a digital SQUID magnetometer for widely varying fields in urban environment  
T. Reich, Oktober 2009, Technische Universität Ilmenau  
Referenz
  1554. Development of a bandwidth measurement for photo diodes  
M. Meister, X-FAB Workshop 'Process Development & Characterisation Workshop on Innovation', 15.-16.11.2006, Luisenthal  
Referenz
  1555. Development and validation of a simplified coil model for CFD simulation of a nano-positioning planar drive system  
Ina Naujokat, Ludwig Herzog Steffen Hesse Parastoo Salimitari Euspen Special Interest Conference: Precision & Performance 2025, Proceedings: https://www.euspen.eu/euspen-knowledge-base/proceedings-search/#!/event=9944, November 18-20, 2025, Cranfield University, United Kingdom  
Referenz
  1556. Development of a vertical wafer stage for high vakuum applications  
E. Beckert, A. Hoffmann E. Saffert Micro- and Nano-Engineering 2000, September 2000  
Referenz
  1557. Developing and Testing RF modules in CMOS for ISM Bands using PXI platform  
Björn Bieske, Klaus Heinrich Transactions on Systems, Signal & Devices (TSSD), Vol. 8, No. 4, pp. 1-13  
Referenz
  1558. Developing and Testing RF modules in CMOS for ISM and SRD Bands using PXI platform  
B. Bieske, K.Heinrich 9th International Multi-Conference on Systems, Signals and Devices (SSD), 2012, Chemnitz, 20.03.2012-23.3.2012  
Referenz
  1559. Developing and Testing RF modules in CMOS for ISM and SRD Bands using PXI platform  
B. Bieske, K.Heinrich 9th International Multi-Conference on Systems, Signals and Devices (SSD), 2012, Digital Object Identifier: 10.1109/SSD.2012.6197945, http://ieeexplore.ieee.org, IEEE Xplore Digital Library, E-ISBN 978-1-4673-1589-0  
Referenz
  1560. Detection of micronewton forces in tribology  
M. Scherge, S.I. Ahmed O. Mollenhauer F. Spiller tm - Technisches Messen Heft 7-8/2000  
Suchergebnis 1551 bis 1560 von 2115