1551. A novel technique for CAD-optimization of analog circuits with bipolar transistors   B. Dimov, V. Boos T. Reich Ch. Lang E. Hennig R. Sommer Advances in Radio Science, 7, 219-223, 2009  

  1552. A Novel Technique for CAD-Optimization of Analog Circuits with Bipolar Transistors   B. Dimov, V. Boos T. Reich Ch. Lang E. Hennig R. Sommer Kleinheubacher Tagung, 22.-25. September 2008, Miltenberg, Germany  

  1553. A Novel Low-Voltage Bandgap Reference Topology   M. Isikhan, 21. Mikroelektronik-Seminar, 16.04.2009, Erfurt  

  1554. A novel low leakage EEPROM cell for application in an extended temperature range (-40°C up to 225°C)   S. Richter, D. Kirsten D. Nuernbergk S. Richter A novel low leakage EEPROM cell for application in an extended temperature range (-40°C up to 225°C), D. Flandre et al. (eds.), Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Enviroment, pa: 285-290, Kluwer Academic Publishers, Januar 2005  

  1555. A novel low leakage EEPROM cell for application in an extended temperature range (-40°C up to 225°C)   D. Kirsten, D. Nuernbergk S. Richter St. Richter Workshop 'SOI NATO Advanced Research', 25-30.04.2004, Kiev, Ukraine  

  1556. A new XY linear stage for Nano technology - The stage can draw 3 diameter true circle   F. Spiller, O. Mollenhauer Tokyo/Japan, Advanced Photonics Technology Exhibition, November 2003  

  1557. A new tool for industrial tribology - Filling the gap between macro- and nano-tribology   S. Achanta, D. Drees J.-P. Celis O. Mollenhauer F. Spiller 14th International Colloquium 'Tribology and Lubrication Engineering', Esslingen, January 13-15 2004  

  1558. A New Low Voltage Bandgap Reference Topology   M. Isikhan, T. Reich A. Richter E. Hennig International Conference on Electronics Circuits and Systems, 13.-16. Dezember, 2009, Hammamet, Tunesien  

  1559. A Modular Platform to Build Task Specific IoT Network Solutions for Agriculture and Forestry   Silvia Krug, Marco Goetze Sören Schneider Tino Hutschenreuther 2023 IEEE International Workshop on Metrology for Agriculture and Forestry (MetroAgriFor), Pisa, Italy, November 06-08, 2023, pp. 820-825, DOI: https://doi.org/10.1109/MetroAgriFor58484.2023.10424104  

  1560. A modular application specific active test environment for high-temperature wafertest up to 300 °C   Michael Meister, Marco Reinhard International Conference and Exhibition on High Temperature Electronics Network (HiTEN 2019), 8 - 10 July 2019, St. Anne’s College in the University of Oxford, Oxford, United Kingdom, DOI: https://doi.org/10.4071/2380-4491.2019.HiTen.000122