2115 Ergebnisse
Referenz
  581. Optimization of Analog Circuits with Automatic Device Type Selection  
B. Dimov, V. Boos T. Reich C. Lang E. Hennig R. Sommer Xth International Workshop on Symbolic and Numerical Methods, Modeling and Applications to Circuit Design (SM²ACD'08), 7.-8. Oktober 2008, Erfurt, Germany  
Referenz
  582. Optimization of Analog Circuits with Automatic Device Type Selection  
B. Dimov, V. Boos T. Reich C. Lang E. Hennig R. Sommer Xth International Workshop on Symbolic and Numerical Methods, Modeling and Applications to Circuit Design (SM²ACD'08), pp 44-48, 07.-08. Oktober, Erfurt, 2008  
Referenz
  583. Optimierung industrieller Echtzeitanwendungen auf Basis von Open-Source-Technologien  
S. Schramm, 4. Innovationsforum 'Software Saxony', 23.04.2010, Dresden  
Referenz
  584. Optimierung der Bewässerung im Obstbau durch Sensorikeinsatz  
Martin Penzel, Silvia Krug Regionalkonferenz EXPRESS, 22. - 23. September 2021, Weingut Schloss Proschwitz, Meißen  
Referenz
  585. Optical, mechanical and electro-optical design of an interferometric test station for massive parallel inspection of MEMS and MOEMS  
Dr. Ch. Schäffel, S. Michael B. Leistritz M. Katzschmann N. Zeike K. Gastinger M. Kujawinska M. Jozwik S. Beer 10. International Conference of the Euspen Society for Precision Engineering & Nanotechnology, 31.05.2010-04.06.2010, Delft, Niederlanden  
Referenz
  586. Optical, mechanical and electro-optical design of an interferometric test station for massive parallel inspection of MEMS and MOEMS  
K.Gastinger, K.H.Haugholt M. Kujawinska M.Jozwik C. Schäffel S. Beer Paper 7389-56, SPIE Europe Optical Metrology, 14.- 18. Juni 2009, München  
Referenz
  587. Optical detected magnetic resonance (ODMR) of ASi-Sii defects: case of acceptor indium  
Kevin Lauer, Bernd Hähnlein Mario Bähr Kai Kühnlenz Philipp Kellner Dirk Schulze Stefan Krischok Alexander Rolapp Christian Möller Thomas Ortlepp 4th DRD3 week on Solid State Detectors R&D, 10. –14. November 2025, CERN, Zürich, Schweiz  
Referenz
  588. Operation and performance evaluation of vertical nanopositioners for 10 mm stroke in a 3D lift and tilt test setup  
Steffen Hesse, Michael Katzschmann Alex S. Huaman Stephan Gorges Eberhard Manske euspen – Special Interest Group Meeting: Precision Motion Systems & Control, 15th – 16th November 2022, s-Hertogenbosch, The Netherlands, NL  
Referenz
  589. Ontwikkeling van apparatuur vor materiaalonderzoek onder hoogvacuüm (Devices for the examination of materials and pairings of materials in standard atmosphere and ultra high vacuum  
F. Spiller, O. Mollenhauer M. Scherge Constructeur, Verlag ten Hagen & Stam, Den Haag, 2001, 40. Jahrgang, ISSN 0010-6658  
Veranstaltung
  590. Online-Stammtisch Sensorik 4.0  
Diagnoselösungen in der industriellen Anwendung  
Suchergebnis 581 bis 590 von 2115