581. OPTOELECTRONICS BiCMOS OEIC for optical storage systems   M. Heise, K. Kieschnick H. Pleß H. Zimmermann Electronics Letters, September 1998  

  582. Optischer Sensor und Verstärker in BiCMOS   M. Heise, H. Pleß Design & Elektronik, September 1998  

  583. Optische Kommunikation nach IEEE 1394b über POF   H.Töpfer, 09.03.2004, 18. Fachgruppentreffen ITG-FG 5.4.1. Optische Polymerfasern, Erfurt  

  584. Optimizing the IoT Performance: A Case Study on Pruning a Distributed CNN   Eiraj Saqib, Isaac Sánchez Leal Irida Shallari Axel Jantsch Silvia Krug Mattias O'Nils 2023 IEEE Sensors Applications Symposium (SAS), 18-20 July 2023, Ottawa, ON, Canada, July 18-20, 2023, pp. 1-6, DOI: https://doi.org/10.1109/SAS58821.2023.10254054.  

  585. Optimized Measurement Methods Evaluating Crosstalk in different SOI Technologies   Björn Bieske, Dagmar Kirsten Michael Frey Andreas Ott 2025 IEEE 22nd International Multi-Conference on Systems, Signals & Devices (SSD), Monastir, Tunisia, 2025, pp. 1315-1321, DOI: https://doi.org/10.1109/SSD64182.2025.10989885  

  586. Optimization of Analog Circuits with Automatic Device Type Selection   B. Dimov, V. Boos T. Reich C. Lang E. Hennig R. Sommer Xth International Workshop on Symbolic and Numerical Methods, Modeling and Applications to Circuit Design (SM²ACD'08), 7.-8. Oktober 2008, Erfurt, Germany  

  587. Optimization of Analog Circuits with Automatic Device Type Selection   B. Dimov, V. Boos T. Reich C. Lang E. Hennig R. Sommer Xth International Workshop on Symbolic and Numerical Methods, Modeling and Applications to Circuit Design (SM²ACD'08), pp 44-48, 07.-08. Oktober, Erfurt, 2008  

  588. Optimierung industrieller Echtzeitanwendungen auf Basis von Open-Source-Technologien   S. Schramm, 4. Innovationsforum 'Software Saxony', 23.04.2010, Dresden  

  589. Optimierung der Bewässerung im Obstbau durch Sensorikeinsatz   Martin Penzel, Silvia Krug Regionalkonferenz EXPRESS, 22. - 23. September 2021, Weingut Schloss Proschwitz, Meißen  

  590. Optical, mechanical and electro-optical design of an interferometric test station for massive parallel inspection of MEMS and MOEMS   Dr. Ch. Schäffel, S. Michael B. Leistritz M. Katzschmann N. Zeike K. Gastinger M. Kujawinska M. Jozwik S. Beer 10. International Conference of the Euspen Society for Precision Engineering & Nanotechnology, 31.05.2010-04.06.2010, Delft, Niederlanden