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154.
Characterizing Dynamics of MEMS Devices on Wafer Level Using Optical Measurement Techniques
Pressemitteilungen
155.
Zuverlässige und schnellere Chip-Designs durch invasive und parametrische Simulationsmethoden
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157.
LO and Calibration Signal Distribution in a Multi-Antenna Satellite Navigation Receiver
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158.
Tip-based nanofabrication below 40 nm combined with a nanopositioning machine with a movement range of Ø100 mm