1551. Parameter extraction such as layer thickness and stress at wafer level for process monitoring in semiconductor manufacturing   Steffen Michael, Microstructure User Meeting 2026, Symposium zur optischen Schwingungsmessung, March 19, 2026, Waldbronn, Germany  

  1552. Parameter Identification of Membrane Structures - Chances and Limitations   S. Michael, SSI 2010 - MEMUNITY Workshop, 24.03.2010, Grenoble, France  

  1553. Parameter Identification of MEMS Membrane and Beam Structures by Modal Analysis and Dynamic Measurements   St. Michael, ANSYS Conference & 27. CADFEM Users' Meeting, 18. - 20. November 2009, Leipzig  

  1554. Parameter Identification of Piezoelectric AlGaN/GaN Beam Resonators by Dynamic Measurements   St. Michael, K. Brueckner F. Niebelschuetz K. Tonisch C. Schäffel 10th EuroSimE 2009, 26.-28. April, Delft, Netherlands  

  1555. Parameteridentifikation von MEMS auf Wafer-Level mittels dynamischer Messungen   S. Michael, R. Paris S. Hering 6. ITG/GI/GMM-Workshop Multi-Nature Systems: Entwicklung von Systemen mit elektronischen und nichtelektronischen Komponenten, Februar 2007, Erfurt  

  1556. Parametric Measurement Unit and Pin Electronics for modular Mixed Signal Test Systems   A. Rolapp, R. Paris Chip, Packaging, Design, Simulation and Test - International Conference, Workshop and Table-top Exhibition 'Semiconductor Conference Dresden 2009' (SCD 2009), 29. - 30. April 2009, Dresden  

  1557. Parametric Measurement Unit und Pinelektronik für ein modulares Mixed Signal Testsystem   A. Rolapp, R. Paris 21. Workshop 'Testmethoden und Zuverlässigkeit von Schaltungen und Systemen' (TuZ 2009), Tagungsband S. 86, 15. - 17. Februar 2009, Bremen  

  1558. Parasitic Symmetry at a Glance: Uncovering Mixed-Signal Layout Constraints   Georg Gläser, Benjamin Saft Ralf Sommer FAC 2017, Frontiers in Analog CAD, Frankfurt on the Main, Germany, 21-22 July 2017, pp. 1-6. URL: http://ieeexplore.ieee.org/document/8011279/  

  1560. Passive 350 GHz Video Imaging Systems for Security Apllications   E. Heinz, T. May D. Born G. Zieger S. Anders V. Zakosarenko H.-G. Meyer C. Schäffel Journal of Infrared, Millimeter and Terahertz Waves manuscript No., DOI: http://dx.doi.org/10.1007/s10762-015-0170-8, Online ISSN: 1866-6906, Print ISSN: 1866-6892, Volume 36, Number 7, July 2015